Unlock instant, AI-driven research and patent intelligence for your innovation.

A Histogram Similarity Measurement Method

A similarity measurement and histogram technology, applied in the field of image processing, can solve the problems of low matching accuracy, slow column calculation, and inability to accurately calculate similarity, and achieve the effect of good robustness and high accuracy.

Inactive Publication Date: 2017-06-23
JIANGSU UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Whether it is to find the distance between points in the feature space or the correlation between feature vectors, only the values ​​​​of the corresponding columns of the two histograms are calculated, and the distribution of the histograms is not considered. Therefore, when the histogram is affected by noise or illumination, etc. When the graph is shifted and deformed, these metrics will not be able to accurately calculate its similarity
James Hafner et al. proposed the quadratic form distance in the article "Efficient color histogram indexing for quadraic form distance functions". By using a similarity matrix to add cross-column information, the matching between different columns of two histograms is realized. However, due to the The method will overestimate the similarity of feature distribution and lead to low matching accuracy
Madirakshi Das et al. proposed the peak matching method in the article "Searching for multi-colored objects in a diverse image database", but this method usually has a better matching effect on specific images in specific applications, and is not universal enough
Yossi Rubner et al. proposed the EMD (earth mover's distance) method in the article "The earth mover's distance as a metric for image retrieval". It is not sensitive to the small shift of the histogram, but it is difficult to apply to the histogram with too few and too few bars. In the case of too many columns, the "ground distance" cannot be obtained when there are too few columns, and the calculation is slow when there are too many columns, and the optimal allocation problem must be considered in the matching process, which is highly complex

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Histogram Similarity Measurement Method
  • A Histogram Similarity Measurement Method
  • A Histogram Similarity Measurement Method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The present invention will be further described below in conjunction with the accompanying drawings and specific examples of implementation.

[0026] figure 1 Shown is a schematic diagram of histogram similarity measurement by conventional methods. When using conventional similarity measurement methods such as Euclidean distance to calculate the similarity of two histograms, because only the values ​​​​of the corresponding columns of the two histograms are calculated, it will be judged as A is similar to C, but A is actually similar to B when viewed with the naked eye. Conventional similarity measurement methods do not take into account the histogram distribution, resulting in matching errors.

[0027] figure 2 Shown is the flow chart of the histogram similarity measurement method of the present invention. Including the following steps:

[0028] 1) Histogram normalization: normalize two histograms to be compared for similarity, assuming that the two histograms are ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of image processing, and particularly relates to a histogram similarity measuring method based on hierarchical matching. The histogram similarity measuring method comprises the steps of histogram normalization, histogram classification, classification similarity judgment and histogram similarity measurement. The histogram similarity measuring method well overcomes the defects that in existing histogram matching, shifting is sensitive, robustness is weak and accuracy is not high, is good in robustness and high in accuracy, and establishes solid foundation for further operation based on histogram matching.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a histogram similarity measurement method based on hierarchical matching. Background technique [0002] Histogram is a very important analysis tool in image processing, which can reflect the distribution of global information such as image grayscale, texture, and color. It is widely used in image matching, target tracking, audio processing and other fields because of its simple calculation and invariance to scale, translation, and rotation of images. The matching accuracy between histograms will directly affect the correctness of subsequent operations. The existing histogram similarity measurement methods mainly include distance measurement methods, such as Manhattan distance, Euclidean distance, Hausdorff distance, central moment method, x 2 Statistical distance, etc.; correlation calculation methods, such as cosine correlation, Pearson product-moment correlation, hist...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/44
CPCG06T7/44
Inventor 李峰陆宇芹金红潘雨青尤优
Owner JIANGSU UNIV