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Dimension measuring device based on linear array CCD

A measuring device and linear array technology, applied in the field of measurement, can solve the problems that the material to be measured is not allowed to contact, the contact method is not suitable, etc., and achieves the effects of improved device accuracy, low cost, and clear and accurate imaging

Inactive Publication Date: 2015-03-25
徐世铭
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  • Claims
  • Application Information

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Problems solved by technology

However, the contact method is not suitable for some special occasions, such as continuous running production lines; some occasions where the environment is harsh or the measured object material is not allowed to contact

Method used

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  • Dimension measuring device based on linear array CCD

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Embodiment Construction

[0010] As shown in the figure, the present invention includes an imaging system, the imaging system is connected with a single-chip microcomputer through a linear array CCD, a video signal processing module, and a binarization processing module, the linear array CCD is connected with a driving circuit, and the single-chip microcomputer is also connected with a display module, a keyboard, and a The modules are connected.

[0011] As a preferred solution, the single-chip microcomputer adopts AT89C51 single-chip microcomputer.

[0012] Choice of optical system.

[0013] The stability and accuracy of imaging on the CCD image sensor have a great influence on the system accuracy. This requires the optical system to have good imaging, less stray light, uniform illumination distribution on the image surface, and small geometric distortion of imaging. We choose helium-neon laser as the light source, the biggest feature of the laser is its good directionality. After expanding...

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Abstract

The invention belongs to the measuring field, particularly relates to a dimension measuring device based on a linear array CCD and employs a non-contact measurement mode. The dimension measuring device based on the linear array CCD comprises an imaging system. The dimension measuring device based on the linear array CCD is characterized in that the imaging system is connected with a single-chip microcomputer through the linear array CCD, a video signal processing module and a binary processing module, the linear array CCD is connected with a driving circuit, and the single-chip microcomputer is further connected with a display module, a keyboard and a pulse module.

Description

technical field [0001] The invention belongs to the field of measurement, in particular to a size measuring device based on a linear array CCD. Background technique [0002] In general applications, the measurement of one-dimensional size is done by contact, such as using a vernier caliper to measure the size of the workpiece. However, the contact method is not suitable for some special occasions, such as continuous running production lines; some occasions where the environment is harsh or the measured object material is not allowed to contact. Contents of the invention [0003] The present invention aims at the above problems, and provides a dimension measuring device based on a linear array CCD that completes the measurement by non-contact means. [0004] In order to achieve the above object, the present invention adopts the following technical solutions. The present invention includes an imaging system, and its structural points are: the imaging system is connected wit...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
Inventor 徐世铭乔俊丁晨辉
Owner 徐世铭
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