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A probe for measuring impact

A detection head and detection hole technology, applied in the detection field, can solve problems such as misoperation, and achieve the effect of simple structure, good stability, and strong anti-electromagnetic interference ability

Inactive Publication Date: 2016-08-24
HANGZHOU DIANZI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since the signal generated by the impact process is close to the sharp pulse, external noise and electromagnetic pulse interference will also affect the traditional force sensor pair, resulting in misoperation

Method used

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  • A probe for measuring impact
  • A probe for measuring impact
  • A probe for measuring impact

Examples

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Embodiment Construction

[0019] like figure 1 As shown, a probe for measuring impact includes a probe main body, an upper cap, a lower cap, an impact conductor, a mechanoluminescent sheet, a background light diode, and an avalanche diode.

[0020] The probe body 1 is a cylinder, and the outer wall of the upper part is tapped with threads; the probe body is provided with an impact conduction hole 1-1 and a detection hole 1-2 along the axis, and the impact conduction hole 1-1 and the detection hole 1-2 are connected and penetrate the probe On the two end faces of the main body 1, the inner diameter of the detection hole 1-2 is larger than the inner diameter of the conduction hole 1-1, and the side wall of the detection hole 1-2 is tapped with threads.

[0021] The upper cap 2 is a cylinder with one end open, and the upper cap 2 is threadedly connected to the upper part of the probe body 1, and an impact conduction cavity 3 is formed between the top surface of the probe body 1 and the bottom surface of t...

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Abstract

The invention discloses an impact measuring probe. An impact conduction piece is movably arranged in a probe body. An upper cap and a lower cap are fixed to the two ends of the probe body respectively. A force-induced light-emitting sheet, an avalanche diode and a background light diode are arranged in the probe body. One end of the impact conduction piece stretches out of the upper end cap, and the spherical surface of the other end of the impact conduction piece makes contact with the avalanche diode. The force-induced light-emitting sheet is made of an Al2SrO4 (Dy, Eu) long-lasting phosphor material or is formed by plating a quartz substrate with an Al2SrO4 (Dy, Eu) long-lasting phosphor material film. When impact force is conducted to the impact conduction piece, the force-induced light-emitting sheet emits light under the impact force, the emitted light is received and amplified by the avalanche diode, and then a current signal corresponding to the impact strength is output. The impact force sensor is simple in structure, good in stability, high in electromagnetic interference resisting capacity and especially suitable for environments with severe electromagnetic pulse interference, and no power supply is needed in a force-light conversion part.

Description

technical field [0001] The invention belongs to the technical field of detection, and in particular relates to a probe for measuring impact. Background technique [0002] The impact process is the process in which objects collide or strike each other. In the process of collision or impact, there is a force between objects that increases suddenly and then disappears quickly, which is impulsive force or collision force. The characteristic of the impact force is that the action time is extremely short, but the magnitude can reach a large value. Because the interaction time of shock or collision is very short, it is difficult to measure the shock or collision in a very short time. [0003] Generally, a force sensor is used to measure the impact process. The structure of the sensor has a column type, a diaphragm type, etc., and the mechanical quantity is converted into an electrical signal through a force-sensitive membrane. Ordinary force sensors generally detect and amplify ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01L5/00
Inventor 季振国李鹤沈冬冬
Owner HANGZHOU DIANZI UNIV
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