Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Low-noise current fine adjustment reference source

A current fine-tuning, low-noise technology, applied in the direction of adjusting electrical variables, control/regulation systems, instruments, etc., can solve the problems of high cost, large chip area, etc., and achieve the effect of eliminating noise and imbalance

Active Publication Date: 2015-04-22
SUZHOU VOCATIONAL UNIV
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These resistor trimming methods are expensive and require a large chip area

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Low-noise current fine adjustment reference source

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0010] The present invention is described below in conjunction with accompanying drawing.

[0011] as attached figure 1 Shown is the low-noise current fine-tuning reference source of the present invention, which includes an operational amplifier OPAMP, a resistor R1, and a resistor R2; one end of the resistor R1 is connected to the node INP through the negative feedback of the operational amplifier OPAMP, and the other end is connected to the operational amplifier OPAMP The output terminal VOUT of the operational amplifier is connected; one end of the resistor R2 is connected to the node INN by the negative feedback of the operational amplifier OPAMP, and the other end is connected to the output terminal VOUT of the operational amplifier OPAMP; the resistor R1 is connected in series with the resistor R0 to a PNP type dual The emitter of the polar transistor Q1 is grounded again; the resistor R2 is connected to the emitter of the PNP bipolar transistor Q2, and then grounded; th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a low-noise current fine adjustment reference source. The reference source comprises an operational amplifier OPAMP, a resistor R1 and a resistor R2. The ends of the resistor R1 and the resistor R2 are connected with the output end VOUT of the operational amplifier OPAMP respectively. The other end of the resistor R1 is connected with a negative feedback enable node INP of the operational amplifier OPAMP. The other end of the resistor R2 is connected with a negative feedback enable node INN of the operational amplifier OPAMP. The resistor R1 and the resistor R2 are connected in series to be connected with an emitter of a PNP type bipolar transistor Q1 and then grounded. The resistor R2 is connected with an emitter of a PNP type bipolar transistor Q2 and then grounded. Resistors R3, R4 and R5 are added on the resistor R1 current branch. Resistors R4, R6 and R8 are added on the resistor R2 current branch, and fine adjustment of the resistor R1 and the resistor R2 is completed through control signals CON1, CON2 and CON3. A chopping module MOD is arranged on the resistor R1 and resistor R2 current branch, and by switching the current on the R1 and R2 passage dynamically, noise and detuning of the current can be eliminated.

Description

technical field [0001] The invention relates to a low-noise current fine-tuning reference source which achieves the purpose of adjusting the output voltage by adjusting the mirror current and can eliminate the noise and imbalance of the current mirror at the same time. Background technique [0002] Bandgap reference sources are widely used in various analog, digital-analog mixed-signal and power management integrated circuits, and their accuracy usually directly determines the accuracy of the entire system. With the continuous reduction of the feature size of integrated circuits and the continuous decrease of power supply voltage, the random errors caused by the mismatch of components have a great impact on the accuracy of low-voltage reference sources. In order to obtain a reference source with low output noise, the offset voltage caused by the process must be effectively reduced. Low offset design methods mainly include auto-zero technology, fine-tuning technology and cho...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G05F1/56
Inventor 李亮
Owner SUZHOU VOCATIONAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com