High-resolution multi-wavelength laser intensity distribution detector and measurement method implemented by same
A technology of laser intensity and high resolution, applied in the field of laser parameter measurement, it can solve the problems of difficulty in improving resolution and limitation of photocell size, and achieve the effects of high resolution measurement, resolution measurement and system volume reduction.
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[0030] Such as figure 1 As shown, it is a schematic structural diagram of an embodiment provided by the present invention, including an incident laser, a sampling target surface, a mirror, an optical filter, an image acquisition device, a network switch, and a data processing device. The reflector is located behind the sampling target surface, and a spot collection device is arranged in front of the reflective surface of the reflector; the reflective surface of the reflector and the sampling target surface form an angle of 10 to 80 degrees, and the reflector is used to increase the sampling target surface. The optical path of the light spot imaging light reduces the angle of view of the imaging, and the reflective surface of the mirror and the spot acquisition device form an angle of 0 to 60 degrees; the data collected by the spot acquisition device is transmitted to the data processing device through the network switch .
[0031] Such as figure 2 As shown, the shape of the...
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