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High-resolution multi-wavelength laser intensity distribution detector and measurement method implemented by same

A technology of laser intensity and high resolution, applied in the field of laser parameter measurement, it can solve the problems of difficulty in improving resolution and limitation of photocell size, and achieve the effects of high resolution measurement, resolution measurement and system volume reduction.

Active Publication Date: 2015-05-06
INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS
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AI Technical Summary

Problems solved by technology

At present, the most used measurement equipment is array detectors. Array detectors are generally composed of sampling attenuation units and photoelectric conversion devices such as photoelectric cells arranged according to certain rules. On the one hand, due to the size limitation of photoelectric cells, it is difficult to improve the resolution; On the other hand, the array detector can only measure one wavelength of laser light at the same time, and in practical applications, it may be necessary to measure several wavelengths of laser light at the same time. There is no related equipment and reports at present.

Method used

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  • High-resolution multi-wavelength laser intensity distribution detector and measurement method implemented by same
  • High-resolution multi-wavelength laser intensity distribution detector and measurement method implemented by same

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Embodiment Construction

[0030] Such as figure 1 As shown, it is a schematic structural diagram of an embodiment provided by the present invention, including an incident laser, a sampling target surface, a mirror, an optical filter, an image acquisition device, a network switch, and a data processing device. The reflector is located behind the sampling target surface, and a spot collection device is arranged in front of the reflective surface of the reflector; the reflective surface of the reflector and the sampling target surface form an angle of 10 to 80 degrees, and the reflector is used to increase the sampling target surface. The optical path of the light spot imaging light reduces the angle of view of the imaging, and the reflective surface of the mirror and the spot acquisition device form an angle of 0 to 60 degrees; the data collected by the spot acquisition device is transmitted to the data processing device through the network switch .

[0031] Such as figure 2 As shown, the shape of the...

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Abstract

The invention relates to a high-resolution multi-wavelength laser intensity distribution detector which comprises a sampling target surface, a reflecting mirror, narrow-band filters, light spot acquisition devices, a network switchboard and a data processing device. A measurement method includes enabling the sampling target surface to carry out diffuse transmission sampling on incident laser light; enabling the image acquisition devices to form images of sampled light spots by the aid of the reflecting mirror; transmitting light spot data to the data processing device by the aid of the network switchboard; enabling the data processing device to correct shape distortion and intensity distortion of the light spots and then analyzing and processing the light spots; acquiring laser intensity distribution parameters by means of computing. The high-resolution multi-wavelength laser intensity distribution detector and the measurement method have the advantage that distribution of the intensity of the laser light with various wavelengths can be simultaneously accurately and quantitatively measured at high resolution.

Description

technical field [0001] The invention belongs to the technical field of laser parameter measurement, and in particular relates to a high-resolution multi-wavelength laser intensity distribution detector and a measurement method thereof. Background technique [0002] Lasers are increasingly used in scientific research, industry, national defense and other fields, and it is often necessary to measure laser parameters such as intensity distribution, centroid, and uniformity. At present, the most used measurement equipment is array detectors. Array detectors are generally composed of sampling attenuation units and photoelectric conversion devices such as photoelectric cells arranged according to certain rules. On the one hand, due to the size limitation of photoelectric cells, it is difficult to improve the resolution; On the other hand, array detectors can only measure one wavelength of laser light at the same time, but in practical applications it may be necessary to measure se...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/00G01J1/04
Inventor 庞淼张卫袁学文高学燕胡晓阳周文超周山何均章
Owner INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS
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