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Quality control method and device

A technology of a control device and a quality control system, applied in the field of quality control methods and devices, can solve problems such as inability to monitor and analyze production links in real time, and inability to meet actual needs, so as to ensure timeliness and reliability, fast response, and reliability. sexual effect

Inactive Publication Date: 2015-06-17
杭州掌企科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of this, the purpose of the embodiments of the present invention is to provide a quality control method and device to improve the quality control method in the prior art through statistical process control. Analyze the problems in each production link that cannot meet the actual needs

Method used

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Examples

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Embodiment 1

[0054] Statistical Process Control (SPC) is a commonly used product quality control method at present. SPC believes that when the process is only affected by random factors, the process is in a state of statistical control, referred to as the controlled state; when there are systematic factors in the process The process is in a statistically out-of-control state, referred to as the out-of-control state. Due to the statistical regularity of process fluctuations, when the process is under control, the process characteristics generally obey a stable random distribution; when the process is out of control, the process distribution will change. SPC uses the statistical regularity of process fluctuations to analyze and control the process. Therefore, it emphasizes that the process is operated under control and capability, so that products and services can stably meet customer requirements. The process of implementing SPC is generally divided into two steps: first, use SPC tools to ...

Embodiment 2

[0070] Such as Figure 5 As shown, the embodiment of the present invention provides a quality control device, which is applied to a quality control system. The quality control system includes a collection device and the quality control device. The quality control device is preset with a data correspondence relationship. The data correspondence includes the standard parameter range value corresponding to the collection device and the equipment on the production line of the product to be controlled corresponding to the collection device; The data parameters after the equipment on the production line of the product to be controlled, the quality control device includes: an obtaining unit 600, configured to obtain the product to be controlled collected by the collection device and corresponding to the product to be controlled by the collection device The data parameters after the equipment on the production line; the judging unit 601 is used to judge whether the data parameters obt...

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Abstract

The embodiment of the invention provides a quality control method and device. The quality control method and device solve the problems that the production process of products can only be analyzed afterwards, and production links cannot be controlled or analyzed in real time in the prior art. The method includes the steps that the quality control device acquires data parameters which are acquired by an acquisition device and obtained after to-be-controlled products pass equipment on a to-be-controlled product production line corresponding to the acquisition device; whether the acquired data parameters are located within a standard parameter value range corresponding to the acquisition device or not is judged, if not, the data parameters not located within the standard parameter value range corresponding to the acquisition device are counted, and if the number of the data parameters, not located within the standard parameter value range corresponding to the acquisition device, acquired by the acquisition device exceeds a preset threshold value, the equipment on the to-be-controlled product production line corresponding to the acquisition device is adjusted and controlled. By the adoption of the method, all the production links can be monitored and analyzed in real time, implementation is convenient, and application and popularization are easy.

Description

technical field [0001] The invention relates to product testing technology, in particular to a quality control method and device. Background technique [0002] Statistical Process Control (SPC) is a process control tool based on mathematical statistics. It analyzes and evaluates the production process, discovers the symptoms of systemic factors in time according to the feedback information, and takes measures to eliminate their influence, so that the process can be maintained in a controlled state only affected by random factors, so as to achieve the purpose of quality control. The inventor found through research that the existing method of quality control through statistical process control can only analyze the production process of the product afterwards, and cannot monitor and analyze each production link in real time, and cannot meet actual needs. Contents of the invention [0003] In view of this, the purpose of the embodiments of the present invention is to provide ...

Claims

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Application Information

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IPC IPC(8): G05B19/418
CPCG05B19/41875Y02P90/02
Inventor 周超群
Owner 杭州掌企科技有限公司
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