Method for achieving random verification through normal distribution

A normal distribution and random verification technology, applied in the field of chip random verification, can solve the problems of not being able to quickly achieve the required results, increase manpower and material resources, and low verification accuracy, achieve good results, improve efficiency and accuracy, and verify the process clear effect

Inactive Publication Date: 2015-06-17
INSPUR GROUP CO LTD
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Using the normal distribution method can make more scientific use of existing resources to achieve the purpose of verification, and solve the problem of using standard distribution in the random verification of chip codes, which leads to a large increase in manpower and material resources required for the verification process to be too redundant, and the accuracy of verification is very low. Defects such as not being able to quickly achieve the desired result

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for achieving random verification through normal distribution

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0015] The random verification method using normal distribution described in this embodiment is based on a normal distribution with a higher degree of symmetry and probability. The simulation verification requirements for random verification of large-scale chips. In addition, using the normal distribution method to add more precise configurations according to specific needs by changing the operation mode of parameters increases the scalability of change.

[0016] The method for random verification using normal distribution described in this embodiment, the required configuration includes: (1) constructing a chip verification environment; (2) converting the normal distribution into required code modules and connecting them to the chip verification environment; (3) Construct an output module for receiving normal random verification results and connect it.

[0017] The above (2) converts the normal distribution part into the required code module and connects with the chip verific...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for achieving random verification through normal distribution, and relates to the field of chip random verification. Random verification controllability and accuracy are achieved by controlling parameters. A needed chip verification environment is built at first, and used as an input to be connected with a normal distribution part; internal processing is carried out after normal distribution is input, the internally-processed data are output to an output result module after being handled, and a random verification result formed after mathematical distribution is obtained. According to the method, random verification can achieve the expected result more efficiently, the chip random verification efficiency and accuracy are improved, and the whole verification process is clearer.

Description

technical field [0001] The invention relates to the field of chip random verification, in particular to a random verification method using normal distribution. Background technique [0002] Random testing is an important supplementary method to execute use case testing according to the test specification, and it is an effective way and process to ensure the integrity of test coverage. Random testing is mainly to retest some important functions of the chip code, and also includes testing those parts that are not covered by the current test cases (Test Case). Focus on checking some special situations, special usage environments, and concurrency. [0003] Theoretically, each chip code version needs to perform random testing, especially for the final version to be released. Random testing is best performed by testers who are familiar with the software being tested and have extensive testing experience. The more familiar they are with the software being tested, the easier it is...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 符云越童元满李仁刚
Owner INSPUR GROUP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap