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A processing system and method for infrared imaging system netd

A technology of an infrared imaging system and a processing method, which is applied in the field of infrared imaging system testing, can solve problems such as troublesome testing and poor flexibility, and achieve the effects of simple algorithm, convenient use, and reduced errors

Active Publication Date: 2017-10-24
BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
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Problems solved by technology

[0009] The measurement method using special test equipment is to place the infrared imaging system within the effective imaging distance, and use collimator, blackbody, target, and image data processing software for testing. figure 2 It is the block diagram of the special test equipment. This method is a real measurement method, but it requires special test equipment, testers and enough space. Especially in the case of a large infrared imaging system, the test is very troublesome and the flexibility is not good. powerful

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  • A processing system and method for infrared imaging system netd
  • A processing system and method for infrared imaging system netd
  • A processing system and method for infrared imaging system netd

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Embodiment Construction

[0037] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings:

[0038] The present invention proposes a processing system and method for NETD (Noise Equivalent Temperature Difference) of an infrared imaging system. The method is obtained through continuous summarization and practice after fully comparing existing testing methods. In order to better complete the calculation of the noise equivalent temperature difference, it is necessary to build a test platform, which specifically includes a standard blackbody radiation source, focal plane components, and an image acquisition system. The block diagram is as follows: image 3 shown.

[0039] Figure 4 It is a composition block diagram of the NETD processing system of the present invention, which includes a parameter setting module, a data acquisition module, an image display module, a state display module, a NETD calculation module, and a storage modul...

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Abstract

The invention relates to a processing system and method for an infrared imaging system NETD, the method includes a parameter setting module, a data acquisition module, an image display module, a status display module, a NETD calculation module, a storage module, etc., and the parameter setting module is used to set The temperature value of the standard radiation source, the number of acquisitions N and the number of random pixels M, the data acquisition module and the storage module are used to complete the data acquisition and storage functions, and the calculation module mainly completes the acquisition data gray average value, mean square noise, NETD calculation, the state display module is used to display the current operating state, and the image display module is used to display the current grayscale image. The present invention avoids the use of complicated NETD test equipment and professional operators, and can obtain the infrared imaging system. Noise equivalent temperature difference.

Description

technical field [0001] The invention belongs to the field of infrared imaging system testing, and relates to a processing system and method for NETD (noise equivalent temperature difference) of an infrared imaging system. Background technique [0002] The performance parameters of the laboratory evaluation infrared imaging system can be divided into two categories: the subjective performance parameters, which are obtained by the observer through human eyes, including the minimum resolvable temperature difference (MRTD) and the minimum detectable temperature difference (MDTD); One is the objective performance parameters, which are obtained by radiation measurement or electrical parameter measurement, and have parameters reflecting signal transfer characteristics (such as signal transfer, spectral transfer, geometric transfer, strong signal response, low frequency response, system time response), reflecting optical Parameters of transfer characteristics (such as modulation tra...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00
Inventor 宋立国
Owner BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
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