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Method for evaluating ground potential rise tolerance capability of intelligent assembly

A technology of smart components and ground potential, which is applied in the direction of measuring electricity, measuring electrical variables, and testing dielectric strength.

Active Publication Date: 2017-12-08
BEIHANG UNIV +2
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  • Abstract
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Problems solved by technology

However, during the test, there are differences in the ground potential waveforms at different positions of GIS shells with different voltage levels and different structures, and the topological structures of smart components from different manufacturers are also quite different. The reliability of the combined form is tested and verified, and there is still no detection method and preventive means for GIS ground potential, and damage to smart components occurs from time to time during field operation and testing

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  • Method for evaluating ground potential rise tolerance capability of intelligent assembly
  • Method for evaluating ground potential rise tolerance capability of intelligent assembly
  • Method for evaluating ground potential rise tolerance capability of intelligent assembly

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Embodiment Construction

[0017] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0018] The invention is a method for evaluating the ability of an intelligent component to withstand a rise in ground potential. The process is as follows: figure 1 shown, including the following steps:

[0019] Step 1: Set the normal working threshold level of smart components;

[0020] The smart component CPU usually uses a logic level of 3.3V. In order to ensure its reliable operation, it is set to 1 / 2 of the logic level value of the threshold level of the smart component, which is set to 1.6V.

[0021] Step 2: Establish an equivalent model of smart components;

[0022] A third-order Butterworth low-pass filter is chosen as the smart component equivalent model.

[0023] Step 3: Adjust the parameters of the equivalent model of the smart component;

[0024] Electrical fast transient / burst immunity (Electrical Fast Transient / Burst, EFT / B) is one o...

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Abstract

The invention discloses a method for evaluating ground potential rise tolerance capability of an intelligent assembly. The method comprises the following steps: 1) setting a normal working threshold level of the intelligent assembly; 2) establishing an equivalent model of the intelligent assembly; 3) adjusting parameters of the equivalent model of the intelligent assembly; and 4) evaluating ground potential rise tolerance capability of the intelligent assembly. For different voltage grades and GIS in different structures, difference of ground potential signals on a housing is larger under the condition of bus charging current switching, so that test cost is high when various ground potential signals are applied to the intelligent assembly one by one; and by applying the equivalent model of the intelligent assembly to simulation analysis, interference signal levels obtained after different actually-measured ground potential signals are applied to the intelligent assembly can be known quickly.

Description

technical field [0001] The invention relates to a method for evaluating the ability of an intelligent component to withstand ground potential rise, and belongs to the technical field of high-voltage switch tests. Background technique [0002] In order to test the electromagnetic compatibility performance of smart components and meet the needs of engineering applications, since 2012, the State Grid Corporation of China has successively released performance testing solutions for intelligent gas-insulated metal-enclosed switchgear (hereinafter referred to as "GIS"), integrating smart components, sensors and GIS The design is integrated, and the overall test assessment is carried out according to the layout of the site. The reliability test is mainly based on the GIS equipment type test standard, combined with the site operating conditions, and selects typical test items that may affect the reliability of the smart component operation. However, during the test, there are differe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/12G01R31/327G06F17/50
CPCG01R31/001G01R31/1254G01R31/3271G06F30/20
Inventor 武建文冯英金鑫晨兰剑李德阁寇晓适黄兴泉董曼玲袁洋
Owner BEIHANG UNIV
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