Unlock instant, AI-driven research and patent intelligence for your innovation.

An Arbitrary Waveform Generator

An arbitrary waveform and generator technology, applied in the field of arbitrary waveform generators, can solve the problems of limited output frequency range, limited sampling rate frequency range, limited voltage controlled oscillator frequency range, etc., to improve frequency resolution, improve The effect of bandwidth utilization and sampling rate convenience

Active Publication Date: 2019-09-17
SUZHOU RIGOL PRECISION ELECTRIC TECH
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

So if you want to change the sampling rate of the waveform, you need to change the clock source frequency or the waveform length. The former needs to reconfigure the phase-locked loop in the clock source, and the latter takes a long time to rewrite the waveform file.
Moreover, the following problems will occur when resetting the phase-locked loop: 1. The ratio between the output frequency of the phase-locked loop and the reference clock (fixed frequency) is M*N / Q, M, N, and Q are integers, and take The value range is limited, and the accuracy of the ratio M*N / Q is poor, so the frequency resolution of the sampling rate of the prior art is poor; 2, the frequency range of the voltage-controlled oscillator (VCO) inside the phase-locked loop is limited, Moreover, when the parameters of the peripheral auxiliary components of the phase-locked loop are fixed, the output frequency range (lowest frequency, highest frequency) is also very limited, so the frequency range of the sampling rate is limited
[0006] As mentioned above, the prior art lacks an arbitrary waveform generator that can make full use of the bandwidth of the DRAM memory, and can easily change the sampling rate of the output waveform, and the frequency resolution of the sampling rate is better and the frequency range is not limited. device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An Arbitrary Waveform Generator
  • An Arbitrary Waveform Generator
  • An Arbitrary Waveform Generator

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] Introduce preferred embodiment of the present invention below in conjunction with accompanying drawing.

[0021] refer to figure 2 , the arbitrary waveform generator in this embodiment includes a clock unit 201 , a control unit 202 , a DRAM memory 203 , a digital-to-analog conversion unit 204 and a waveform generation unit 205 .

[0022] In this embodiment, the clock unit 201 is used to generate a system clock 210 with a frequency of F; to provide working clocks for each component unit in the arbitrary waveform generator 2 .

[0023] As an example, the clock unit 201 may adopt a PLL structure in the prior art.

[0024] In this embodiment, the control unit 202 is used to receive the sampling rate S, and the control unit 202 also includes the following functions: for realizing the system control function of the arbitrary waveform generator 2, for connecting an external measuring instrument, network or computer interface functions, as well as functions such as parameter...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an arbitrary waveform generator. A clock unit is used for generating a system clock. A dynamic random access memory (DRAM) is used for storing waveform data. A control unit is used for receiving a sampling rate. A waveform generation unit is used for generating a digital waveform according to the waveform data. A digital-analog conversion unit is used for converting the digital waveform into an analog waveform and then outputting the analog waveform. The waveform generation unit comprises a preread accumulator, a DRAM controller, a First In First Out (FIFO) memory and a phase accumulator. The preread accumulator is used for generating a preread accumulated value. The DRAM controller is used for getting waveform data out of the DRAM according to the preread accumulated value. The phase accumulator is used for generating an FIFO read enable signal according to the sampling rate. The FIFO memory is used for storing the waveform data and sending the waveform data to the digital-analog conversion unit according to the FIFO read enable signal. The arbitrary waveform generator can improve the bandwidth use ratio of the DRAM, and the sampling rate and resolution ratio of the output waveform.

Description

technical field [0001] The invention relates to the field of test and measurement, in particular to an arbitrary waveform generator. Background technique [0002] As a signal source, a signal generator is widely used in the measurement, calibration and maintenance of electronic systems because it can generate regular or irregular waveforms with different frequencies and different amplitudes. With the development of electronic chip integration, signal generators based on programmable logic array (FPGA) technology have rich functions, including function generators, arbitrary waveform generators, pulse generators, harmonic generators, analog / digital Modulator, frequency sweep generator, burst signal generator and other functions in one. [0003] Among them, the arbitrary waveform generator is used to meet the signal generation requirements of arbitrary waveforms. refer to figure 1 , is a structural diagram of an arbitrary waveform generator 1 in the prior art. The clock mod...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03K3/02
Inventor 丁新宇王悦王铁军李维森
Owner SUZHOU RIGOL PRECISION ELECTRIC TECH