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Machine vision based optical film surface defect detecting method

A technology for optical thin film and defect detection, which is applied in the direction of optical test flaws/defects, can solve problems such as optical thin film detection, achieve high-efficiency detection, realize defect detection, and improve the effect of utilization

Inactive Publication Date: 2015-07-22
WUHAN INSTITUTE OF TECHNOLOGY
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Problems solved by technology

[0005] Aiming at the problems in the prior art, the present invention provides a method for detecting defects on the surface of optical films based on machine vision. The method of the present invention fully considers that current film cutting machines cannot directly detect defects on optical films, and uses machine vision detection technology and image processing Technology, realized the automatic defect detection of the film cutting machine, and used the average filter to obtain the image background, effectively realized the defect detection of the optical film, and improved the utilization rate of product raw materials

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[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0026] In an embodiment of the present invention, a method for detecting defects on the surface of an optical film based on machine vision is provided, comprising the following steps: 1) collecting an image of the surface of the optical film, and performing smoothing processing on the surface image of the optical film; 2) smoothing the surface image of the optical film Extract the background image and binarize the surface image of the optical film; 3) Identify the defects according to the image features of different defects.

[0027] Wherein, in the step 1), smoothing is performed on the image on t...

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Abstract

The invention discloses a machine vision based optical film surface defect detecting method, and provides a machine vision based optical film surface defect detecting method. The method comprises the following steps: firstly, acquiring an optical film surface image, and carrying out smooth treatment on the optical film surface image; secondly, extracting a background image from the optical film surface image after smooth treatment and carrying out binarization processing; and thirdly, recognizing defects according to image features of different defects. According to the method, defects of a film cutter are detected automatically by utilizing a machine vision detecting technique and an image processing technique; the image background is obtained by utilizing mean filtering, so that the defects of an optical film is detected, and the product raw material utilization ratio is improved. According to the invention, the machine vision based optical film surface defect detecting method detects the optical film surface defect relatively accurately and efficiently.

Description

technical field [0001] The invention belongs to the field of optical thin film measurement, and in particular relates to a machine vision-based detection method for optical thin film surface defects. Background technique [0002] Machine vision is a method of using computers to analyze images obtained from cameras. It mainly studies the use of computers to simulate human visual functions, extract information from images of objective things, process and understand them, and finally use them for actual measurement and control. Machine vision technology is gradually emerging on the basis of the successful application of remote sensing image processing and medical image processing technology in the 1970s, and is a branch of image processing. At present, machine vision technology has been widely used in many industries, among which medical imaging, car navigation, visual measurement, technical diagnosis and other directions are developing the fastest. [0003] With the advancem...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
Inventor 胡婷婷金国祥
Owner WUHAN INSTITUTE OF TECHNOLOGY
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