Dielectric substrate measurement apparatus based on multi-resonant waveguide substrate integration vibration cavity method and method thereof

A technology of substrate integration and dielectric substrate, which is applied in measurement devices, measurement of electrical variables, measurement of resistance/reactance/impedance, etc., can solve the problem of inability to realize fast broadband test, and achieve simple design, convenient processing, and quality factor. high effect

Active Publication Date: 2015-08-26
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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However, this method is limited to the test of a single frequency p

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  • Dielectric substrate measurement apparatus based on multi-resonant waveguide substrate integration vibration cavity method and method thereof
  • Dielectric substrate measurement apparatus based on multi-resonant waveguide substrate integration vibration cavity method and method thereof
  • Dielectric substrate measurement apparatus based on multi-resonant waveguide substrate integration vibration cavity method and method thereof

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Embodiment Construction

[0029] The present invention will be described in further detail below in conjunction with specific embodiments and accompanying drawings.

[0030] Substrate-integrated waveguide multi-resonator, including multiple resonators 2 and standard W-band metal feed waveguide 1, the design feature of resonator 2 is that, viewed from left to right, 201-20N are N substrate-integrated waveguide resonators . The resonant cavity 201-20N is viewed as a square from the top view. In order to satisfy the resonant frequency with a fixed frequency interval, the size of the 201-20N gradually decreases. The initial value of the design size can be determined according to the HFSS eigenmode simulation. The resonant cavity 2 includes, from top to bottom, an upper metal-clad copper 23, a dielectric 22, a lower metal-clad copper 21, and a metallized hole 24 that runs through the upper metal-clad copper 23, the dielectric 22, and the metal-clad copper 21. 211-21N are The coupling slots on the copper-cl...

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Abstract

The invention relates to the dielectric substrate characteristic measurement field and especially discloses a dielectric substrate measurement apparatus based on a multi-resonant waveguide substrate integration vibration cavity method. The apparatus comprises a standard W frequency band metal feed waveguide and N resonant cavities. The apparatus is characterized in that the shape of the N resonant cavities is square and the N resonant cavities are arranged in a slotted shape from left to right; resonant frequencies are successively decreased according to a fixed frequency interval. The measurement method is characterized in that a vector network analyzer is used and is connected to a feed port of a standard metal waveguide through coaxial feed; according to the recorded S parameter data on the vector network analyzer and Smith chart data, a no-load resonant frequency f110 is calculated through a formula; and then simulation software HFSS is used to carry out intrinsic model simulation so as to acquire values of dielectric constants epsilon r and tan delta of the dielectric from the f110. By using the apparatus and the method in the invention, high precision measurement can be performed on the dielectric constant of the dielectric substrate and a loss tangent in a wide frequency band.

Description

technical field [0001] The invention relates to the field of measurement of dielectric substrate characteristics, in particular to the measurement of dielectric constant and loss characteristics of dielectric substrate materials, specifically a dielectric substrate measurement device and method based on waveguide multi-harmonic substrate integrated vibration cavity method. Background technique [0002] Printed circuit board technology has been widely used in various fields, among which the characteristics of dielectric materials are important indicators to measure the microwave characteristics of circuit boards, including dielectric constant and loss. Accurate understanding of these two properties of dielectric substrates is essential for various applications of dielectric materials in the microwave frequency range. [0003] After decades of development, the testing technology of dielectric constant and loss has formed a relatively complete testing system. At present, in th...

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Application Information

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IPC IPC(8): G01R27/26
Inventor 程钰间刘小亮吴杰薛飞
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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