Silver-lead-silicate glass for electroconductive paste composition
A technology of conductive paste and composition, applied in conductive coatings, conductive materials dispersed in non-conductive inorganic materials, circuits, etc., can solve problems such as high contact resistance
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Embodiment 1
[0100] A first exemplary glass composition ("Glass A") was prepared as described in Table 1. The weighed ingredients were mixed in a pestle and mortar. The mixture was then transferred to an alumina crucible and melted at about 900-1200° C. in an electric furnace type KLS 45 / 11 from Themconcept, Dr. Fischer GmbH & Co. KG, Bremen (Germany). Pour the melt into water to form a frit. These frits were transferred to a glass containing glass with a median particle size of 0.8mm GRINDING MEDIA (ball type) in sintered alumina grinding jars. Dry or wet grinding to the desired glass particle size is carried out by rotating the sintered alumina grinding jar containing the grinding mixture in a planetary ball mill PM 400 from Retsch, Germany. The speed is about 30-300min -1 .
[0101] Table 1. Composition of Exemplary Glass A
[0102] components
Amount (weight% of glass)
PbO
78.83
SiO 2
9.20
Al 2 o 3
4.20
ZnO
0.96
...
Embodiment 2
[0111]A second exemplary glass composition ("Glass B") was prepared according to the preparation method of Example 1. Glass B compositions are described in Table 4. The composition of Glass B was adjusted compared to Glass A to determine the increase in Ag content in the glass. 2 The effect of the amount of O.
[0112] Table 4. Composition of Exemplary Glass B
[0113] components
[0114] Glass B was then mixed with the components described in Table 5 according to the preparation method of Example 1 to form an exemplary paste composition (Paste B).
[0115] Table 5. Composition of Exemplary Paste B
[0116] components
[0117] Paste B and the control paste from Example 1 were screen printed as described in Example 1 on the front side of a lightly doped p-type silicon wafer, dried and fired. The resulting solar cells were then tested by the procedure provided in Example 1 and fully described herein. The normalized electrical properties of Exemplary Past...
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