Complex spectrum multi-spot radiation scaling method for Fourier transform spectrometer

A technology of Fourier transform and radiation calibration, applied in the field of photoelectric calibration, which can solve problems such as errors
CN105043548AInactive Publication Date: 2015-11-11BEIJING INST OF ENVIRONMENTAL FEATURES
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
BEIJING INST OF ENVIRONMENTAL FEATURES
Publication Date
2015-11-11
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a complex spectrum multi-spot radiation scaling method for a Fourier transform spectrometer. The complex spectrum multi-spot radiation scaling method for a Fourier transform spectrometer comprises: respectively acquiring measuring voltage values (shown in the description) corresponding to n temperature spots of a Fourier transform spectrometer, wherein n>=2; calculating the spectral radiance (shown in the description) of each temperature spot; calculating the practical linear gain (shown in the description) for the Fourier transform spectrometer under each wave number v and the practical offset (shown in the description) for the Fourier transform spectrometer under each wave number v; and acquiring the target spectral radiance (shown in the description) input by the Fourier transform spectrometer through the following formula (shown in the description).
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Description

technical field

[0001] The invention relates to the technical field of photoelectric calibration, in particular to a complex spectrum multi-point radiation calibration method suitable for Fourier transform spectrometers. Background technique

[0002] Fourier transform spectrometer is based on two-beam interferometry, using the principle of Fourier transform to achieve spectral measurement equipment. Due to the advantages of high signal-to-noise ratio, high resolution and fast measurement, Fourier transform spectrometer has been widely used in chemical industry, geology, medicine, environment, meteorology, military affairs, space technology and other fields. What the existing Fourier transform spectrometer actually measures is the interferogram of the incident light. In an ideal state, the interferogram is symmetrical, and the real spectrum can be obtained through the Fourier transform of the interferogram. However, due to the influence of instrument errors, environmental i...

Claims

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