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Complex spectrum multi-spot radiation scaling method for Fourier transform spectrometer

A technology of Fourier transform and radiation calibration, applied in the field of photoelectric calibration, which can solve problems such as errors

Inactive Publication Date: 2015-11-11
BEIJING INST OF ENVIRONMENTAL FEATURES
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Problems solved by technology

Such a processing method will produce certain errors, especially for data with large phase deviations.

Method used

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  • Complex spectrum multi-spot radiation scaling method for Fourier transform spectrometer
  • Complex spectrum multi-spot radiation scaling method for Fourier transform spectrometer
  • Complex spectrum multi-spot radiation scaling method for Fourier transform spectrometer

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[0029] In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following will describe in detail with reference to the accompanying drawings and specific examples.

[0030] The principle of the present invention is as figure 1 shown.

[0031] In the normal state of the Fourier transform spectrometer, the Fourier transform spectrometer can be approximated as a linear response system. That is: when the input of the system is the target spectral radiance L(v) (the unit of the target spectral radiance L(v) is W / cm 2 ·sr·cm -1 ), then the output of the system is each wave number v obtained by the Fourier transform spectrometer (unit cm -1 ) under the measured voltage value M (v) (unit is V / cm), and the relationship between input and output is the response function of the Fourier transform spectrometer. Therefore, the process of radiometric calibration is also a process of solving the instrument response func...

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Abstract

The invention discloses a complex spectrum multi-spot radiation scaling method for a Fourier transform spectrometer. The complex spectrum multi-spot radiation scaling method for a Fourier transform spectrometer comprises: respectively acquiring measuring voltage values (shown in the description) corresponding to n temperature spots of a Fourier transform spectrometer, wherein n>=2; calculating the spectral radiance (shown in the description) of each temperature spot; calculating the practical linear gain (shown in the description) for the Fourier transform spectrometer under each wave number v and the practical offset (shown in the description) for the Fourier transform spectrometer under each wave number v; and acquiring the target spectral radiance (shown in the description) input by the Fourier transform spectrometer through the following formula (shown in the description).

Description

technical field [0001] The invention relates to the technical field of photoelectric calibration, in particular to a complex spectrum multi-point radiation calibration method suitable for Fourier transform spectrometers. Background technique [0002] Fourier transform spectrometer is based on two-beam interferometry, using the principle of Fourier transform to achieve spectral measurement equipment. Due to the advantages of high signal-to-noise ratio, high resolution and fast measurement, Fourier transform spectrometer has been widely used in chemical industry, geology, medicine, environment, meteorology, military affairs, space technology and other fields. What the existing Fourier transform spectrometer actually measures is the interferogram of the incident light. In an ideal state, the interferogram is symmetrical, and the real spectrum can be obtained through the Fourier transform of the interferogram. However, due to the influence of instrument errors, environmental i...

Claims

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Application Information

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IPC IPC(8): G01J3/45
Inventor 何茜王广平武敬力张亚洲雷浩刘畅
Owner BEIJING INST OF ENVIRONMENTAL FEATURES
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