Fast cooling furnace body of horizontal diffusion furnace

A technology of diffusion furnace and cooling furnace, which is applied in the direction of furnace, furnace cooling, furnace components, etc. It can solve the problems that the quality of film formation is not easy to guarantee, the temperature repeatability in the furnace body is poor, and the natural cooling rate is slow, so as to reduce the impact of temperature fluctuations. The influence of semiconductor parts, the effect of stable and reliable working environment

Active Publication Date: 2016-01-06
48TH RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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AI Technical Summary

Problems solved by technology

In the conventional cooling method, the wafer is usually placed in the wafer boat of the furnace body, and the wafer is cooled by the natural cooling of the furnace body, but the existing problem is that the natural cooling rate is slow, resulting in long process time and poor film quality. easy to guarantee
The traditional water cooling method for rapid cooling has problems such as large heat dissipation and high power consumption; while the traditional air cooling method will be affected by the external environment, resulting in temperature fluctuations and poor repeatability of the furnace temperature

Method used

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  • Fast cooling furnace body of horizontal diffusion furnace
  • Fast cooling furnace body of horizontal diffusion furnace
  • Fast cooling furnace body of horizontal diffusion furnace

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Embodiment Construction

[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0027] Figure 1 to Figure 5 A kind of embodiment of the fast cooling furnace body of the horizontal diffusion furnace of the present invention is shown, the fast cooling furnace body of the horizontal diffusion furnace includes a reaction quartz tube 2 and a resistance furnace body 1 sleeved outside the reaction quartz tube 2, and the reaction quartz Between the outer wall of the tube 2 and the inner wall of the resistance furnace body 1 there is a columnar gap with an annular cross section, and both ends of the columnar gap are provided with seals 6 so that the columnar gap forms a closed ventilation channel 16, and the resistance furnace body 1 is provided with a The ventilation channel 16 has an air inlet 14 for supplying air and an air outlet 15 for discharging hot air in the ventilation channel 16 . When the process reaches the...

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Abstract

The invention discloses a fast cooling furnace body of a horizontal diffusion furnace. The fast cooling furnace body comprises a reaction quartz tube and a resistance furnace body arranged outside the reaction quartz tube in a sleeving manner. A columnar clearance with an annular cross section is arranged between the outer wall of the reaction quartz tube and the inner wall of the resistance furnace body. Sealing pieces are arranged at the two ends of the columnar clearance so that a closed ventilation channel can be formed by the columnar clearance. The resistance furnace body is provided with an air inlet for supplying air to the ventilation channel and air outlets for exhausting hot air in the ventilation channel. The fast cooling furnace body has the beneficial effects that the fast cooling function is achieved, and the influence of temperature fluctuation on a semiconductor part is reduced.

Description

technical field [0001] The invention relates to the technical field of manufacturing semiconductor electronic components, in particular to a fast-cooling furnace body of a horizontal diffusion furnace. Background technique [0002] There are many heat treatment processes in the manufacturing process of semiconductor devices, such as thermal oxidation, chemical vapor deposition (CVD), thermal diffusion, metal alloying, impurity activation, and dielectric film densification. These heat treatment processes are very sensitive to temperature, especially the control of rapid cooling ability is very important. In the conventional cooling method, the wafer is usually placed in the wafer boat of the furnace body, and the wafer is cooled by the natural cooling of the furnace body, but the existing problem is that the natural cooling rate is slow, resulting in long process time and poor film quality. Easy to guarantee. This treatment method will increase the diffusion of harmful impu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): F27D9/00F27D19/00H01L21/67
Inventor 刘良玉彭宜昌张宝峰曹骞贾京英
Owner 48TH RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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