Conductive part height test device and test method
A technology for testing devices and testing methods, which is applied to measuring devices, components of electrical measuring instruments, measuring electricity, etc., and can solve problems such as interference and poor contact
Inactive Publication Date: 2016-02-17
SHANGHAI YUDE COMM TECH
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- Application Information
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Problems solved by technology
If it is due to dispensing problems or assembly problems, it may cause poor contact between the two, which will cause various interference problems
Method used
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[0017] In order to make the object, technical solution and advantages of the present invention clearer, various embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. However, those of ordinary skill in the art can understand that, in each implementation manner of the present invention, many technical details are provided for readers to better understand the present application. However, even without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in each claim of the present application can be realized.
[0018] The first embodiment of the present invention relates to a conductive part height testing device, which is used for testing the height of a plurality of conductive parts to be tested on a grounded metal plate. Wherein, the ground metal plate is a metal middle frame of a mobile terminal (such as a smart phone), and a s...
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Abstract
The invention relates to the technical field of conductive test, and discloses a conductive part height test device and a test method. The conductive part height test device comprises a test circuit board, multiple indicating components, and a power supply. The test circuit board contains multiple conductive test parts, and the conductive test parts respectively correspond to conductive parts to be tested. The multiple indicating components are arranged on the test circuit board, and a first end of each indicating component is electrically connected to the corresponding conductive test part. The power supply is connected to a second end of each indicating component. During test, the test circuit board covers a grounding metal plate, and whether the heights of the conductive parts to be tested corresponding to the conductive test parts connected with the indicating components are in line with the requirement is judged according to the state of the indicating components. By adopting the conductive part height test device and the test method provided by the embodiments of the invention, whether the heights of the conductive parts to be tested are in line with the requirement can be tested quickly, and quality assurance is provided for electronic equipment after assembly.
Description
technical field [0001] The invention relates to the technical field of conductive testing, in particular to a testing device and a testing method for the height of a conductive part. Background technique [0002] Important components on the motherboard of electronic equipment must be covered by a shield to prevent signals from interfering with each other. At present, in addition to the traditional shielding cover formed by bending steel sheets, there is also a commonly used shielding cover with dispensing. [0003] Such as figure 1 As shown, the dispensing shielding cover refers to growing a circle of walls 2 on the metal middle frame 1, and dotting flexible conductive glue 3 on the top of the walls; leaving exposed copper at the corresponding position of the main board (not shown). When the main board is assembled, the conductive glue and the exposed copper of the main board are in close contact to achieve a shielding effect. If it is due to dispensing problems or assemb...
Claims
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Login to View More IPC IPC(8): G01R31/00G01R1/00G01R27/02
Inventor 覃绍仕许益明邵一祥
Owner SHANGHAI YUDE COMM TECH