Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A blue-green light-emitting diode chip manufacturing process

A technology of light-emitting diodes and manufacturing processes, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of extended epitaxial production time, low diode luminous efficiency, thick n-type conductive layer, etc., to save epitaxial production time and current The effect of increasing the expansion effect and reducing the thickness

Active Publication Date: 2017-09-05
XIAMEN CHANGELIGHT CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] First, the single-layer n-type conductive layer is in contact with the n-electrode, making the thickness of the n-type conductive layer thicker, prolonging the epitaxial production time and reducing production efficiency
[0006] Second, the single-layer n-type conductive layer is in contact with the n-electrode, and the ohmic contact with the n-electrode cannot be gradually changed by changing the epitaxial material or doping, so that the current spreading effect is poor, and the luminous efficiency of the diode is low.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A blue-green light-emitting diode chip manufacturing process
  • A blue-green light-emitting diode chip manufacturing process
  • A blue-green light-emitting diode chip manufacturing process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0049] refer to Figure 7 As shown, a blue-green light-emitting diode chip disclosed in the present invention includes a p region 1, an n region 2 and an active region 3. The active region 3 is arranged between the p region 1 and the n region 2, and in the p region 1 The p-electrode 11 is arranged on the conductive layer; the epitaxial structure of the n-region 2 adopts a multi-level composite contact layer composed of n-type contact layers and current blocking layers alternately, and n-electrodes 21 with multiple contact surfaces are arranged on the multi-level composite contact layer. An electrode isolation layer 4 is provided between the n-electrode 21 and the active region 3 and the p-region 1 .

[0050] The N-type region of the present invention adopts a composite contact layer epitaxial structure composed of n-type contact layers and c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a blue and green light emitting diode chip manufacturing process. The process comprises the steps of growing an unintentionally doped layer, a first n-type conducting layer, a first current blocking layer, a first n-type contact layer, a second current blocking layer, a second n-type contact layer, a third current blocking layer, a second n-type conducting layer, an active area, a limiting layer, a p-type conducting layer and a p-type contact layer on a substrate successively; performing masking, photo-etching and ICP etching on the p-type contact layer up to the n-type conducting layer; performing masking and photo-etching on the exposed second n-type conducting layer and etching through the third current blocking layer by using ICP to expose the surface of the second n-type contact layer; performing masking and photo-etching again on the exposed surface of the second n-type contact layer and etching through the second current blocking layer by using ICP to expose the surface of the first n-type contact layer; performing masking and photo-etching on the p-type contact layer, and forming an ITO conducting layer on the exposed p-type contact layer through evaporation; manufacturing a p electrode and an n electrode. The blue and green light emitting diode chip manufacturing process can improve the current spreading effect and improve the light emitting efficiency of light emitting diodes.

Description

technical field [0001] The invention relates to the technical field of light-emitting diodes, in particular to a blue-green light-emitting diode chip manufacturing process. Background technique [0002] Light-emitting diodes have been rapidly developed as the main light source due to their low power consumption, small size, and high reliability. Especially in the past ten years, the field of utilization of light-emitting diodes is expanding rapidly. Improving brightness and reducing the cost of light-emitting diodes have become the goals of the development of the LED field. [0003] In the prior art, the blue-green light-emitting diode chip includes a p-region, an n-region and an active region. The active region is arranged between the p-region and the n-region, and a p-electrode is arranged on the conductive layer of the p-region. The n region includes setting an unintentionally doped layer on the substrate, setting an n-type conductive layer on the unintentionally doped ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/00H01L33/14
CPCH01L33/0075H01L33/145
Inventor 林志伟陈凯轩张永姜伟卓祥景方天足陈亮
Owner XIAMEN CHANGELIGHT CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products