Measuring device and method for frequency response of mach-zehnder electrooptical modulator

An electro-optic modulator and frequency response technology, which is applied in the direction of instruments, testing optical performance, image data processing, etc., can solve the problems of difficult calibration and low frequency resolution, and achieve the effect of improving resolution and frequency range and accurate frequency response

Active Publication Date: 2016-06-15
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF6 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to overcome the problems of low frequency resolution, difficult calibration and high bandwidth requirements in the measurement of existing Mach-Zehnder electro-optic modulators, and propose a measurement device and Method for accurate measurement of frequency response of electro-optic modulators with high resolution, no calibration, and low bandwidth requirements

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measuring device and method for frequency response of mach-zehnder electrooptical modulator
  • Measuring device and method for frequency response of mach-zehnder electrooptical modulator
  • Measuring device and method for frequency response of mach-zehnder electrooptical modulator

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0043] The Mach-Zehnder electro-optic modulator to be tested is LiNbO from AVANEX 3 Electro-optic modulator, the frequency of the laser output optical carrier is f 0 =193.1THz, the optical carrier is sent to the Mach-Zehnder electro-optic modulator to be tested for modulation, and the output frequency of the first signal source and the second signal source is f respectively 1 = 24.06GHz and f 2 The sinusoidal signal of =24.0589GHz is loaded on the driving electrode of the Mach-Zehnder electro-optic modulator to be tested through the combiner, and the third signal source output frequency f b The low-frequency sinusoidal signal of =500kHz is loaded on the bias electrode of the Mach-Zehnder electro-optic modulator to be tested, and the optical modulation signal formed after being modulated by the Mach-Zehnder electro-optic modulator to be tested is carried out photoelectric detection by the photodetector to generate The beat frequency signal is sent to the spectrum analysis mod...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a measuring device and a measuring method for frequency response of a mach-zehnder electrooptical modulator, which belong to the field of photoelectronic technologies, and aim at overcoming the problems of low frequency resolution, difficult calibration and high bandwidth requirement in the existing measurement. The measuring method comprises the steps of: transmitting a beam of light carrier into a mach-zehnder electrooptical modulator to be measured directly, utilizing a first signal source and a second signal source which are applied on a driving electrode and a third signal source applied on a bias electrode of the mach-zehnder electrooptical modulator to be measured for modulation, wherein the first signal source and the second signal source output sinusoidal signals with frequency difference, and the third signal source outputs a low-frequency signal; transmitting a light modulation signal into a photoelectric detector directly to perform beat frequency operation, extracting amplitudes of three specific frequency mixed signals from a beat frequency signal, and acquiring a modulation factor and a half-wave voltage of the mach-zehnder electrooptical modulator to be measured at single modulation frequency; and scanning frequency of an RF signal to obtain frequency response of the mach-zehnder electrooptical modulator to be measured.

Description

technical field [0001] The invention belongs to the field of optoelectronic device testing, and in particular relates to a measuring device and method for the frequency response of a Mach-Zehnder electro-optic modulator. Background technique [0002] The Mach-Zehnder electro-optic modulator is a key device in optical communication systems and microwave photonic links. With the continuous improvement or expansion of the operating rate and operating frequency, the frequency response of the Mach-Zehnder electro-optic modulator often affects the entire system or chain. Therefore, it is very important to accurately measure the frequency response of Mach-Zehnder EO modulators to realize broadband electro-optical signal conversion and optimize the transmission capacity of communication systems. [0003] At present, the methods for measuring the frequency response of Mach-Zehnder EO modulators mainly include spectral analysis method, frequency sweep method and heterodyne method. Am...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G06T1/00
CPCG01M11/02G06T1/0085G06T2201/0051
Inventor 张尚剑王恒邹新海刘俊伟张雅丽陆荣国刘永
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products