Method for measuring distance between graphite and metal surface

A metal surface and graphene technology, which is applied in the direction of measuring devices, material excitation analysis, instruments, etc., can solve problems such as the inability to directly measure the distance between graphene surfaces, and achieve the effect of high degree of automation, simple process and easy realization

Inactive Publication Date: 2016-06-22
PEKING UNIV
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  • Claims
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Problems solved by technology

None of the above common nanotechnology characterization methods can directly measure the surface distance between graphene and metal.

Method used

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  • Method for measuring distance between graphite and metal surface
  • Method for measuring distance between graphite and metal surface
  • Method for measuring distance between graphite and metal surface

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Embodiment Construction

[0020] The present invention will be further described below by example. It should be noted that the purpose of the disclosed embodiments is to help further understand the present invention, but those skilled in the art can understand that various replacements and modifications are possible without departing from the spirit and scope of the present invention and the appended claims of. Therefore, the present invention should not be limited to the content disclosed in the embodiments, and the protection scope of the present invention is subject to the scope defined in the claims.

[0021] 1) Synthesis of single-layer graphene film on metal

[0022] in H 2 , Heat the Cu foil to about 1000°C in an Ar gas environment, and then pass CH 4 , split into C and H on the surface of Cu foil, and C was adsorbed by Cu foil. After that in H 2 1. Cool the Cu foil in the Ar gas environment, and C precipitates out during the cooling process, forming a single layer of graphene on the surfac...

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Abstract

The present invention discloses a method for measuring a distance between a graphite and a metal surface based on a spectrometer and a conductive atomic force microscope. By using a phenomenon that a graphene-metal junction can emit light in an atmosphere environment at a particular voltage, with the cooperation of the spectrometer and the conductive atomic force microscope, the control of probe movement is realized, corresponding voltage is measured, the average value of Delta EF is extracted, according to the corresponding relation between the Delta EF and d, the distance d between the graphite at a light emitting point and the metal surface is obtained, and finally the distance distribution map of samples is obtained.

Description

technical field [0001] The invention belongs to the technical field of micro-nano devices, and in particular relates to a method for measuring the distance between graphene and a metal surface based on a spectrometer and a conductive atomic force microscope. Background technique [0002] It is of scientific and technical value to understand the contact characteristics of graphene and metal. For the energy band structure at the contact, the surface distance between the two is an important parameter (Xia, Fengnian, et al. "The origins and limits of metal-graphene junction resistance." Nature nanotechnology6.3( 2011): 179-184.). The undulation of graphene surface (Giovannetti, G., etal."Dopinggraphenewithmetalcontacts."PhysicalReviewLetters101.2(2008): 026803.) and the roughness of metal surface (Wintterlin, Joost, andM-L.Bocquet."Grapheneonmetalsurfaces."SurfaceScience603. 10(2009):1841-1852) makes the spacing variable in spatial distribution, and it is difficult for the exis...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/24G01N21/66
Inventor 王锴成贾越辉王紫东彭沛任黎明傅云义
Owner PEKING UNIV
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