Measuring method for testkey of AMOLED
A test circuit and measurement technology, applied in the direction of instruments, static indicators, etc., can solve the problems of increasing the cost of supporting equipment, additional equipment, increasing the number of independent probes, etc., and achieve the effect of saving the cost of supporting equipment
Active Publication Date: 2016-06-22
EVERDISPLAY OPTRONICS (SHANGHAI) CO LTD
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Problems solved by technology
Also, as the complexity of the circuit increases, the number of independent probes required is likely to increase
[0007] However, usually, the TEG measuring machine used by most LCD panel factories or research institutes is a measuring machine with four independent probes. Therefore, if this general TED measuring machine is to be used to measure The pixel test circuit with nTmC structure (for example, 6T1C structure) needs to be equipped with the necessary number of probes (in the case of 6T1C, it needs to be equipped with 3 additional probes), or it needs to be purchased and equipped with enough independent probes measuring machine
As a result, it is necessary to prepare a corresponding number of probes or corresponding TEG measuring machines for different pixel test circuits, thereby increasing the cost of supporting equipment
Method used
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[0034] Embodiments of the present invention will be described below in conjunction with the accompanying drawings.
[0035] image 3 is to represent the measurement method according to the present embodiment in figure 1 The circuit diagram of adding a test point to the pixel test circuit shown. Specifically, add a test point T on the connection line DL between the gate of the second transistor T2 and the capacitor C, and add a test point T that can be in contact with the wiring layer of the connection line DL in the wiring diagram of the actual product. contact holes, and form contact points made of indium tin oxide or silver at the contact holes. When measuring the pixel test circuit, a voltage signal can be measured or input by making a probe contact with the test point T. Referring to FIG.
[0036] Figure 4 It is a flowchart showing the measuring method of this embodiment. In this embodiment, the pixel test circuit with a 6T1C structure is still taken as an example, a...
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The invention provides a measuring method for measuring an nTmC-structured testkey of an AMOLED by utilizing a TEG measuring machine provided with 4 independent probes. The measuring method is used for measuring through multiple stages such as a compensation step, a buffering step and a light emitting step, additional arrangement of probes is not required, a measuring machine provided with enough independent probes does not need to be purchased, and the testkey can be measured by adopting the measuring method, thereby achieving the university of ordinary TEG measuring machines, and saving cost of corollary equipment used for testing.
Description
technical field [0001] The invention relates to a measurement method for measuring a pixel test circuit (testkey) in an AMOLED product. Background technique [0002] Organic light-emitting diodes (OLEDs) have aroused widespread interest due to the advantages of low cost, low power consumption, high brightness, self-illumination, full color, wide viewing angle, and easy fabrication on flexible substrates. Among organic light-emitting diode displays, AMOLED (ActiveMatrix / OrganicLightEmittingDiode: active matrix organic light-emitting diode panel) products use thin-film field-effect transistors (TFT, hereinafter referred to as transistors) to form pixel circuits to realize the screen display of organic light-emitting diodes. [0003] In the current AMOLED product design, the pixel circuit in the AA area (ActiveArea: effective display area) adopts the structure of nTmC (n≥4, m≥1, m and n are both positive integers). For example, 4T1C / 4T2C / For the circuit design of 5T1C / 6T1C / 6T...
Claims
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IPC IPC(8): G09G3/00G09G3/32
Inventor 董杭
Owner EVERDISPLAY OPTRONICS (SHANGHAI) CO LTD