Metal Young modulus system based on photoelectric sensor

Abstract

The invention discloses a metal Young's modulus system based on a photoelectric sensor, which includes a single-chip microcomputer, a signal conditioning circuit and a photoelectric conversion circuit. The single-chip microcomputer is connected to the signal conditioning circuit, and the signal conditioning circuit is connected to the photoelectric conversion circuit; I-V conversion circuit and filter circuit, the photoelectric conversion circuit is connected to the filter circuit, the filter circuit is connected to the I-V conversion circuit, the I-V conversion circuit is connected to the AD conversion circuit, and the AD conversion circuit is connected to the single-chip microcomputer; the photoelectric conversion circuit It includes a photoelectric sensor and an amplifying circuit, the photoelectric sensor is connected to the amplifying circuit, and the amplifying circuit is connected to the filter circuit; the displacement variation during the metal Young's modulus test is converted into the variation of the corresponding current signal by means of photoelectric conversion , and then processed by a single-chip microcomputer to realize real-time automatic measurement, data processing and display, so as to achieve automation and high precision of Young's modulus measurement.

Description

technical field [0001] The invention relates to the fields of material science, optical communication technology and the like, specifically, a metal Young's modulus system based on a photoelectric sensor. Background technique [0002] The measurement of Young's modulus of metal materials is one of the necessary experiments in the physical experiments of comprehensive universities and engineering colleges. The key to the measurement of Young's elastic modulus of metal wire lies in the accurate measurement of the tiny length of the metal wire. Some domestic laboratories still use the optical lever method to measure the tiny length of the metal wire. The adjustment of the optical path has strict requirements, the measurement is difficult and difficult to master, the operation is cumbersome, and the reading process is prone to errors and takes a long time. In response to the development status and development requirements of domestic university physics experiments, the applicat...

AI Technical Summary

Problems solved by technology

The key to the measurement of Young's elastic modulus of metal wire lies in the accurate measurement of the tiny length of the metal wire. Some domestic laboratories still use the optical lever method to measure the tiny length of the metal wire. The adjustment of the optical path has strict requirements, the measurement is difficult and difficult to master, the operation is cumbersome, and the reading process is prone to errors and takes a long time

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