Voltage batch testing method for CMOS batteries of main boards

A technology of battery voltage and batch testing, applied in the direction of measuring current/voltage, measuring electrical variables, measuring electricity, etc., can solve the risk of large-scale product shipments of computer motherboards, economic losses of production enterprises, and the inability to effectively test the low voltage of CMOS batteries Or missing installation and other problems, to reduce the test time and test cost, ensure the quality of product shipments, and reduce the cost of test equipment

Inactive Publication Date: 2016-08-24
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to ensure the good performance of CMOS batteries for computer motherboard products, it is necessary to prevent the voltage of CMOS batteries from being low or missing during the mass production of motherboards, which will cause the CMOS batteries to be used for a long time after shipment or be directly invalid, causing great damage to computer motherboards. The risk of product shipment, and the return of motherboards due to CMOS battery problems often occur, which brings economic losses to manufacturers and great inconvenience to customers.
In the previous motherboard testing process, ICT testing and functional testing were unable to effectively test the problem of low or missing CMOS battery voltage, which caused computer motherboards with low or missing CMOS batteries to flow into the market, bringing great harm to manufacturers and customers. adverse effect

Method used

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  • Voltage batch testing method for CMOS batteries of main boards
  • Voltage batch testing method for CMOS batteries of main boards
  • Voltage batch testing method for CMOS batteries of main boards

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Embodiment

[0024] In the method for batch testing the main board CMOS battery voltage of the present invention, a CMOS battery voltage detection probe, a power source PS-Enable signal probe and a test board are additionally installed on the main board function testing equipment. The test board is composed of CMOS voltage input connector (RTC Input), voltage comparison circuit, LED lamp and switch circuit. The CMOS battery voltage detection probe is connected to the CMOS battery and the CMOS voltage input connector (RTC Input).

[0025] Such as figure 1 As shown, the test board is connected to the server mainboard through the power supply PS-Enable signal probe and the CMOS voltage input connector (RTC Input).

[0026] Such as figure 2 As shown, the voltage comparison circuit is composed of a voltage comparator, resistor R1, resistor R2 and resistor R3. The voltage comparator is an integrated circuit LM339. The inverting input terminal of the voltage comparator is connected with the ...

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Abstract

The invention discloses a voltage batch testing method for CMOS batteries of main boards, and belongs to the technical field of computer main boards. The voltage batch testing method for the CMOS batteries of the main boards disclosed by the invention is that a CMOS battery voltage detection probe, a power PS-Enable signal probe and a test board are added on main board function test equipment, wherein the test board comprises a CMOS voltage input connector, a voltage comparison circuit and a switch circuit, the CMOS battery voltage detection probe is connected with the CMOS batteries and the CMOS voltage input connector, the voltage comparison circuit is connected with the CMOS voltage input connector and the switch circuit, and the power PS-Enable signal probe is connected with the main boards and the switch circuit. The voltage batch testing method for the CMOS batteries of the main boards disclosed by the invention can rapidly test the effectiveness of the CMOS batteries, greatly lower the test time and cost and improve the output quality of the main boards, and has very good popularization and application values.

Description

technical field [0001] The invention relates to the technical field of computer main board testing, and specifically provides a batch testing method for main board CMOS battery voltage. Background technique [0002] In the current computer, there will be a CMOS chip, which is a readable and writable parallel or serial FLASH chip, which is used to save the basic startup information of the computer, such as date, time, startup settings, etc. The CMOS chip is powered by the CMOS battery, and the information on the CMOS chip will not be lost regardless of whether the computer is turned off or powered off. The CMOS battery is installed in the computer motherboard. In order to ensure the normal operation of the CMOS chip, it is necessary to ensure the normal operation of the CMOS battery on the computer motherboard. In order to ensure the good performance of CMOS batteries for computer motherboard products, it is necessary to prevent the voltage of CMOS batteries from being low o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/36G01R19/165
CPCG01R19/165G01R31/385
Inventor 孙连震王佩亢泽坤
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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