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Power reduction in thyristor random access memory

A technology of thyristor and memory unit, which is applied in the direction of static memory, digital memory information, thyristor, etc., and can solve the problems of reducing device performance and yield

Inactive Publication Date: 2016-10-12
克劳帕斯科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Unfortunately, the use of epitaxial or CVD semiconductor layers at the back end of standard CMOS processes adds thermal cycling and etching steps, which can degrade the performance and yield of other devices formed earlier on the same substrate
Additionally, PNPN devices operating in the breakdown regime present challenges in terms of process control and power consumption

Method used

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  • Power reduction in thyristor random access memory
  • Power reduction in thyristor random access memory
  • Power reduction in thyristor random access memory

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0084] Example 1: All are ones: 1111-1111 becomes 10-0000-1111, so 8 ones become 5 ones.

example 2

[0085] Example 2: 50% + 1 one: 1010_1011 becomes 01_1010_0100, so 5 ones become 4 ones.

example 3

[0086] Example 3: 50% to ones: 1010_1010 becomes 00_1010_1010, so 4 ones become 4 ones.

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PUM

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Abstract

A volatile memory array using vertical thyristors is disclosed together with methods of reducing power consumption in such arrays.

Description

[0001] Cross References to Related Applications [0002] This patent application is related to U.S. Patent Application No. 14 / 841140, entitled "Thyristor Volatile Random Access Memory and Methods of Manufacture", filed on the same date, and entitled "Methods of Reading and Writing Data in a Thyristor Random Access Memory" filed on the same date U.S. Patent Application No. 14 / 841521, filed on the same date, U.S. Patent Application No. 14 / 841578 entitled "Methods of Retaining and Refreshing Data in a Thyristor Random Access Memory"; Priority to U.S. Provisional Patent Application No. 62 / 186336, filed on 29th, entitled "High-Density VolatileRAMs, Method of Operation and Manufacture Thereof," and is entitled "Cross-Coupled Thyristor Continuation-in-Part of U.S. Application No. 14 / 590834 for SRAM Circuits and Methods of Operation, which claims priority to U.S. Provisional Patent Application No. 62 / 055582, filed September 25, 2014; incorporated by reference for all purposes All appli...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C7/00
CPCG11C11/39H10B12/10G11C11/4026G11C11/406H01L29/66363H01L21/76H01L29/87
Inventor H·栾B·贝特曼V·阿克赛尔拉德C·程
Owner 克劳帕斯科技有限公司