Position identification electronic device test system and IP setting method

Abstract

The invention relates to a position identification electronic device test system and an IP setting method. The system comprises a host computer, a test cabinet controller, a function test and simulation device, a number of inverted T type DA conversion circuits, a number of power supplies corresponding to electronic devices to be tested, and a control circuit which controls the power supplies to power the electronic devices to be tested. The output voltage V0 of the inverted T type DA conversion circuits is changed by using the control circuit to sequentially electrify the electronic devices to be tested, and the voltage V0 is input into the test cabinet controller, so as to acquire the current position number of the loaded electronic devices to be tested. The position identification electronic device test system IP setting method has the advantages of simple structure, high reliability, high practicality and the like, can quickly and effectively solve the problem of inconsistent IP and position number, and provides a new scheme for the field of device networking address allocation.

Description

technical field [0001] The invention relates to an electronic equipment testing system with position recognition and an IP setting method, which is used to assign the IP of the electronic equipment under test in the testing system. The method is applicable to various electronic equipment, such as switching power supplies, frequency converters, LED control IP settings for test systems such as controllers and motor controllers. Background technique [0002] The electronic equipment testing system is a platform for comprehensive testing of various functions, performance and safety certification of the electronic equipment under test. Its stability and reliability are directly related to the detection of product defects of the electronic equipment under test. , its importance is self-evident. The electronic equipment test system mainly consists of a host computer (PC), a test cabinet controller, a functional test simulation device, an inverted T-shaped DA conversion circuit, an...

AI Technical Summary

Problems solved by technology

The above two IP address allocation methods have the following problems in the test system: how to ensure that the IP address of the device under test placed at a specific number in the test system is consistent with the placement number

As far as the above-mentioned dynamic IP address setting method is concerned, it is difficult to ensure that the IP address is consistent with the placement location number.

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