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Polarization scattering matrix fast measuring system and method

A polarization scattering matrix and measurement system technology, applied in radio wave measurement systems, instruments, etc., can solve problems such as high cost and complex systems, and achieve the effects of improving measurement accuracy, improving calibration methods, and simplifying polarization measurement systems.

Inactive Publication Date: 2016-11-23
NORTHWESTERN POLYTECHNICAL UNIV
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Problems solved by technology

[0005] In order to solve the problem that the target polarization characteristic measurement accuracy and calibration method need to be further improved without modifying the radar system, and the traditional target polarization scattering characteristic measurement system has high cost and complicated system, the present invention constructs a simple and practical Indoor polarization scattering measurement system and method

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  • Polarization scattering matrix fast measuring system and method
  • Polarization scattering matrix fast measuring system and method
  • Polarization scattering matrix fast measuring system and method

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Embodiment Construction

[0034] Now in conjunction with embodiment, accompanying drawing, the present invention will be further described:

[0035] 1) Build a measurement system: As the core instrument, a high-performance vector network analyzer has two transmitting sources and two receiving ports, which are respectively connected to four standard gain antennas, and the antennas are all fixed on a mounting board.

[0036] 2) Test parameter settings:

[0037] (1) Frequency range: This measurement selects a sweeping range of 8-12GHz, a sweeping width of 4GHz, and a sweeping range that satisfies the far-field condition (R≥2d 2 / λ, R is the test distance, d is the maximum size of the target, λ is the wavelength of the incident wave) and distance resolution (Δd=c / 2BW, c is the speed of light, BW is the sweep width).

[0038] (2) Number of points, according to the test distance R, determine the maximum sweep interval Δf max =c / 2R, calculate the lowest point n min =BW / Δf max , using 801 points (sampling ...

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Abstract

The invention provides a simple and practical indoor polarization scattering measurement system, which is used for obtaining high-polarization-purity scattering data based on a vector network analyzer. The indoor polarization scattering measurement system is formed by the vector network analyzer, antennas, a main control computer, a microwave shielding darkroom and a turntable control cabinet. By filling a part of absorbing materials between the antennas, influence of mutual coupling between the antennas is reduced physically;and after converting broadband step frequency domain data to a time domain, near-end antenna mutual coupling signals are removed by utilizing selectivity of a time domain wave door. High-purity target polarization scattering characteristic data is obtained through a method of setting appropriate parameters and the like for the step frequency signals, and polarization data purity is higher than 45 dB; and the polarization scattering measurement system is simplified, and a lot of production cost is reduced.

Description

technical field [0001] The invention relates to a method for quickly measuring a polarization scattering matrix by using a vector network analyzer, which belongs to the field of microwave measurement. Background technique [0002] The literature "Comparison and comparison of the performance of new methods for target scattering matrix measurement, Journal of System Simulation, 2015, 27(6): 1308-1315" proposes a measurement method based on the polarization characteristics of the antenna space, which can realize the target polarization on the basis of single-polarization radar. However, the measurement accuracy and calibration method of this method need to be further improved only because the current radar system does not need to be modified, and it has certain application prospects. The measurement of the polarization scattering matrix is ​​the basic method to study the polarization scattering characteristics of the target. It has complete polarization information, but due to ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/41
CPCG01S7/41
Inventor 胡楚锋郭鹏陈卫军李南京郭丽芳
Owner NORTHWESTERN POLYTECHNICAL UNIV
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