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Equivalent absorption method for measuring X ray energy spectrum sensitivity of photosensitive film

A photosensitive film and X-ray technology, applied in the field of price absorption, can solve the problems of less film energy spectrum sensitivity, difficult device adjustment, complicated experimental links, etc., so as to reduce the measurement cost, solve the high cost, and simplify the measurement process.

Inactive Publication Date: 2016-12-07
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

[0004] It can be seen that the common problem of the existing methods is that an X-ray monochromatization device with an expensive price and a complex structure is required, the experimental process is complicated, and the device adjustment is difficult, resulting in very few cases where this method is actually used to obtain the sensitivity of the film energy spectrum, and the practicability is poor.

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  • Equivalent absorption method for measuring X ray energy spectrum sensitivity of photosensitive film

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Embodiment 1

[0028] Such as figure 1 As shown, at the bottom of the vacuum chamber 1, the step-shaped multi-thickness sample I2 and multi-thickness sample II3 are placed on the photosensitive film 4. The multi-thickness sample I2 and multi-thickness sample II3 are different in material, and the composition and thickness are known. The X-ray light tube 5 Properly keep away from the multi-thickness sample and fix it on the top of the vacuum chamber 1, so that the X-ray emitted from the X-ray light tube 5 can pass through the thickness sample I2 and the multi-thickness sample II3 approximately in parallel, and the energy spectrum detector 6 is placed in the vacuum chamber In 1, the probe points to the focus position of the X-ray light tube 5 for measuring the X-ray energy spectrum emitted by the X-ray light tube 5; the air in the vacuum chamber 1 is drawn out to form a vacuum environment to avoid the absorption and scattering of X-rays by the air , turn on the X-ray light tube 5, and perform ...

Embodiment 2

[0043] Embodiment 2 is basically the same as Embodiment 1. The main difference is that the optical imaging device can use a microscope or a digital camera, which can obtain higher lateral resolution and is suitable for films under the condition of tiny multi-thickness samples. Spectral Sensitivity Measurements. The data measured by the microscope or digital camera is gray scale, and the gray scale has a single value function relationship with the blackness, so when two multi-thickness samples have the same gray scale, the absorption equation can also be established.

Embodiment 3

[0045] The embodiment 3 is basically the same as the embodiment 1, the main difference is that a direct solution method, such as Gaussian elimination method, can be used to solve the linear equation system. When the thickness range of the multi-thickness standard sample is large, the direct solution method can also be used to solve it.

[0046] This embodiment realizes an equivalent absorption method for measuring the X-ray energy spectrum sensitivity of photosensitive film through a series of measures, and completes the measurement of the X-ray energy spectrum sensitivity of the film. Compared with other methods, there is no need for complex and expensive X-ray single The colorization device only needs one exposure and one film development, which significantly improves the applicability, measurement efficiency and measurement accuracy of measuring film energy spectrum sensitivity.

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Abstract

The invention provides an equivalent absorption method for measuring the X ray energy spectrum sensitivity of a photosensitive film. According to the method, X rays are used to irradiate two multi-thickness samples, two samples are made of different materials, the compositions and thicknesses of two samples are known, X rays expose a photosensitive film, the film is developed and digitalized to obtain black scale or gray scale of negative film; X ray adsorption equations of two multi-thickness samples are established respectively, when the gray scales or black scales of a certain thickness position of two multi-thickness samples are equal, the detected light intensities in two positions are the same, based on the detected equal light intensity, an equation is established; in different thickness positions, the equation is established, and the linear equation set is calculated to obtain the X ray energy spectrum sensitivity of the photosensitive film. The provided method does not need an expensive and complicated X ray monochromatization device, only needs once exposure imaging and once film developing, and prominently improves the practicality, efficiency, and precision of film energy spectrum sensitivity measurement.

Description

technical field [0001] The invention belongs to the technical field of X-ray detection, in particular to an equivalent absorption method for measuring the X-ray energy spectrum sensitivity of a photosensitive film. Background technique [0002] Photosensitive film (hereinafter referred to as "film") has the characteristics of high sensitivity, strong spatial resolution, and wide dynamic response range. As an effective X-ray detection tool, it is widely used in industrial non-destructive testing, medical diagnosis, and plasma detection. and X-ray laser research. Because film is often used in visible light photography, film manufacturers only give the spectral sensitivity (energy spectrum sensitivity) of the film in the visible light and near-ultraviolet spectrum (energy spectrum) range, but do not give the X-ray energy spectrum range. Spectral sensitivity. When studying the X-ray absorption of different elemental components of a material, it is particularly important to obt...

Claims

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Application Information

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IPC IPC(8): G01N23/06
CPCG01N23/06
Inventor 王宗伟马小军王琦孟婕高党忠唐兴陈雪叶成钢顾倩倩姜凯
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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