Sample box for scanning electron microscope testing and testing method by utilization of sample box

A technology of electron microscope and sample box, which is applied in the field of material chemistry research tools, can solve problems such as the inability to realize sample testing, and achieve the effect of preventing deterioration

Inactive Publication Date: 2017-01-04
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] So far, scanning electron microscopy has been widely used in many fields such as material chemistry research, and it is very effective for testing and analyzing the surface morphology of many conventional samples. However, with the deepening of scientific research, some ai

Method used

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  • Sample box for scanning electron microscope testing and testing method by utilization of sample box
  • Sample box for scanning electron microscope testing and testing method by utilization of sample box
  • Sample box for scanning electron microscope testing and testing method by utilization of sample box

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Embodiment Construction

[0015] refer to Figure 1 to Figure 3 , a sample box for scanning electron microscope testing, which includes a box body 1, a box cover 2, a sealing ring 3, a connecting shaft 4, a cover-opening torsion spring 5 and a one-way exhaust valve 6, and the box body 1 is made of conductive metal , such as stainless steel, aluminum alloy, etc., a box cover 2 is provided at the opening of the box body 1, and a sealing ring 3 is provided between the box body 1 and the box cover 2. The box body 1 and the box cover 2 are opened along the connecting shaft 4 The connection is rotated in the closing direction, and the connecting shaft 4 is provided with a cover-opening torsion spring 5, so that the box cover 2 is in an open state under natural conditions, and a one-way exhaust valve 6 is provided on the box body 1, which can suck out the gas in the box .

[0016] Utilize the method for testing with the sample box of above-mentioned scanning electron microscope test, it comprises the followi...

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Abstract

A sample box for scanning electron microscope testing and a testing method by the utilization of the sample box belong to the field of materials chemical research tools. Problems of sample boxes of existing scanning electron microscopes are solved. The sample box for scanning electron microscope testing comprises a box body, a box cover, a seal ring, a connecting shaft, a cover opening torsional spring and a unidirectional bleeder valve. The box body is made of a conductive metal material, such as stainless steel, aluminium alloy and the like. The box cover is arranged at the opening of the box body. The seal ring is disposed between the box body and the box cover. The box body and the box cover are rotatably connected through the connecting shaft along the opening direction. The connecting shaft is provided with the cover opening torsional spring such that the box cover is in an open state under natural conditions. The box body is provided with the unidirectional bleeder valve for pumping gas out of the box. The sample box is used for testing samples which are sensitive to air and moisture.

Description

technical field [0001] The invention belongs to the field of material chemistry research tools, in particular to a sample box for scanning electron microscope testing and a testing method using the same. Background technique [0002] Scanning Electron Microscope, referred to as SEM, is a cell biology research tool invented in 1965. It mainly uses secondary electron signal imaging to observe the surface morphology of the sample, that is, to scan the sample with a very narrow electron beam. The interaction between the electron beam and the sample produces various effects, mainly the secondary electron emission of the sample, which can generate an enlarged topographic image of the sample surface, which is established in time sequence when the sample is scanned, namely Magnified images were obtained using point-by-point imaging. [0003] So far, scanning electron microscopy has been widely used in many fields such as material chemistry research, and it is very effective for tes...

Claims

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Application Information

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IPC IPC(8): G01N23/22
CPCG01N23/22
Inventor 高云智曹毅
Owner HARBIN INST OF TECH
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