Sample box for scanning electron microscope testing and testing method by utilization of sample box

Abstract

A sample box for scanning electron microscope testing and a testing method by the utilization of the sample box belong to the field of materials chemical research tools. Problems of sample boxes of existing scanning electron microscopes are solved. The sample box for scanning electron microscope testing comprises a box body, a box cover, a seal ring, a connecting shaft, a cover opening torsional spring and a unidirectional bleeder valve. The box body is made of a conductive metal material, such as stainless steel, aluminium alloy and the like. The box cover is arranged at the opening of the box body. The seal ring is disposed between the box body and the box cover. The box body and the box cover are rotatably connected through the connecting shaft along the opening direction. The connecting shaft is provided with the cover opening torsional spring such that the box cover is in an open state under natural conditions. The box body is provided with the unidirectional bleeder valve for pumping gas out of the box. The sample box is used for testing samples which are sensitive to air and moisture.

Description

technical field [0001] The invention belongs to the field of material chemistry research tools, in particular to a sample box for scanning electron microscope testing and a testing method using the same. Background technique [0002] Scanning Electron Microscope, referred to as SEM, is a cell biology research tool invented in 1965. It mainly uses secondary electron signal imaging to observe the surface morphology of the sample, that is, to scan the sample with a very narrow electron beam. The interaction between the electron beam and the sample produces various effects, mainly the secondary electron emission of the sample, which can generate an enlarged topographic image of the sample surface, which is established in time sequence when the sample is scanned, namely Magnified images were obtained using point-by-point imaging. [0003] So far, scanning electron microscopy has been widely used in many fields such as material chemistry research, and it is very effective for tes...

AI Technical Summary

Problems solved by technology

[0003] So far, scanning electron microscopy has been widely used in many fields such as material chemistry research, and it is very effective for testing and analyzing the surface morphology of many conventional samples. However, with the deepening of scientific research, some air and water sensitive Research samples, which cannot be tested using the sample box equipped with the existing scanning electron microscope, therefore, a new sample box needs to be designed to ensure that the sample avoids contact with moisture and air during transfer and testing

Images