Stitching testing structure of ZIF (zero insertion force) connector
A test structure and connector technology, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems that affect the test pass rate, time-consuming and labor-intensive, low work efficiency, etc., to ensure the test pass rate and test efficiency, guarantee Effectiveness and efficiency, the effect of reducing labor input
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[0024] Such as Figure 1 to Figure 7 As shown, the present invention includes a PCB board 1 , a needle block 2 , a needle cover 3 , at least two springs 4 and a needle block fixing seat 5 . Positioning pins 11 are arranged on the lower side of the needle block 2, and the setting of the positioning pins 11 is to facilitate rapid positioning when the PCB board is installed. Several probes 6 are fixedly arranged on the needle block 2 , and pinholes 31 are provided on the needle cover 3 for the probes 6 to pass through and are consistent with the number of the probes 6 . For different ZIF connectors 8 to be tested, the number of probes of the needle block and the number of pinholes on the needle cover are set to be consistent with the number of PIN pins of the ZIF connector 8 to be tested. Therefore, for different batches of ZIF connectors, it is only necessary to replace the needle block and the corresponding needle cover. The lower end of the spring 4 is fixed on the needle bl...
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