Test fixture for low pass filter

Abstract

The invention discloses a test fixture for a low pass filter. The test fixture comprises a micrometer sliding table, an adaptive base, a circuit board and a flat spring fixture, wherein a groove is arranged on an upper end face of the adaptive base; a lower end face of the adaptive base is fixedly connected with the micrometer sliding table; the micrometer sliding table is fixed on the base and is capable of adjusting X and Y directions of the adaptive base; the circuit board and a positioning plate are fixedly arranged in the groove from bottom to top; the circuit board is connected with a monitoring device through a wire; the flat spring fixture is fixedly connected with a slide plate; the slide plate is connected with a rear lateral plate through two damping shafts and is capable of moving along the axial direction of a slide rail; a limiting groove for accommodating a detected filter is arranged on the positioning plate; after downward moving, the flat spring fixture is directly faced to the limiting groove. Under the buffering function of the flat spring fixture, the test fixture provided by the invention can prevent the detected component from being damaged by hard pressing. The test fixture can be mounted in the manner of adopting the positioning plate for limiting the position of the detected component and pressing by the flat spring fixture, so that high test efficiency and test result precision can be guaranteed.

Description

technical field [0001] The invention belongs to the technical field of electronic component testing devices, and relates to a low-pass filter testing fixture. Background technique [0002] Passive low-pass filter (such as LFCN-320), its operating frequency is 320MHz, because it is a microwave device, the size is small, the method of directly welding the test line to the device is usually used for testing, and the welding cannot be completed when the size is small and It is especially easy to short-circuit. This test method has serious shortcomings. The properties of the device itself are destroyed during the welding process, and it is time-consuming and labor-intensive. The test process is prone to errors, and the device test cannot be easily completed at all. There is no corresponding fixture at present. carry out testing. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a low-pass filter test fixture, which can...

AI Technical Summary

Problems solved by technology

[0002] Passive low-pass filter (such as LFCN-320), its operating frequency is 320MHz, because it is a microwave device, the size is small, the method of directly welding the test line to the device is usually used for testing, and the welding cannot be completed when the size is small and It is especially easy to short-circu

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