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A mosaic detector geometric correction phantom and correction method

A technology of geometric correction and correction method, applied in the field of radiation imaging, can solve problems such as correction processing, and achieve the effect of ensuring accuracy

Active Publication Date: 2019-03-15
NANOVISION TECHNOLOGY (BEIJING) CO LTD
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Problems solved by technology

[0005] As for the image distortion caused by stitching gaps, there is currently no corresponding method for correction

Method used

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  • A mosaic detector geometric correction phantom and correction method
  • A mosaic detector geometric correction phantom and correction method
  • A mosaic detector geometric correction phantom and correction method

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Embodiment Construction

[0047] The technical content of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0048] Such as figure 2 As shown, the spliced ​​detector geometric correction phantom provided by the present invention includes a geometric correction phantom substrate 1 and a geometric correction phantom mounting plate 2 . Wherein, the geometric correction phantom substrate 1 is a copper-clad laminate, which is a rectangular plate. Four openings are respectively provided at the four ends of the rectangular plate for installing the geometric correction phantom base plate 1 on the geometric correction phantom mounting plate 2 by means of screw connection. The geometric correction phantom substrate 1 is provided with a plurality of metal dots arranged at equal intervals. The metal dots can be made of metals such as tungsten, nickel, copper, etc. Currently, copper dots are usually used. For the convenience of descr...

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Abstract

The invention discloses a splicing detector geometric correction phantom and a correction method. The method includes the following steps: S1, install the geometric correction phantom on the top surface of the splicing detector, so that the metal dots on the geometric correction phantom substrate are evenly distributed on the photon counting chip; S2, take the photon counting chip as the unit, Divide the top surface of the photon counting detector into multiple modules, and calculate the center coordinates of all metal dots in each module based on the positions of the metal dots; S3, calculate the pixels of each module image, and calculate the pixels of each module image according to the position of the metal dots. The pixels of the group image are used to determine whether there are seams between adjacent modules. If there are seams, go to step S4; otherwise, there are no seams between adjacent modules and the image does not need to be corrected; S4, calculate the adjacent modules. The number of pixels that exist between the seams and restore the seam pixels to the image. This method can effectively correct the actual imaging detected by the splicing detector and ensure the accuracy of the image.

Description

technical field [0001] The invention relates to a geometric correction phantom, in particular to a splicing detector geometric correction phantom, and at the same time relates to a correction method for splicing detector correction based on the geometric correction phantom, which belongs to the technical field of radiation imaging. Background technique [0002] In the field of radiation imaging, photon counting imaging technology is currently becoming a research hotspot in the industry due to the low dose of X-rays required. An existing photon-counting imaging detector is a photon-counting imaging device counted by a single X-ray, including: a layer of photosensitive material, a photosensitive material of a photodetector diode layer arranged in an N×M array, an N×M Array readout unit (the readout unit includes a high-gain, low-noise amplifying element, one readout unit is assigned to each photodetector diode); the readout unit is controlled by the data processing element, an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00G06T7/30
CPCG06T2207/20221G06T2207/10116G06T5/80
Inventor 康小维常彤崔志立
Owner NANOVISION TECHNOLOGY (BEIJING) CO LTD
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