Uranium and zirconium system X-ray fluorescent substrate effect correcting method

Abstract

The invention discloses a uranium and zirconium system X-ray fluorescent substrate effect correcting method. The uranium and zirconium system X-ray fluorescent substrate effect correcting method comprises the following steps that a uniform design theory is used for arranging uranium and zirconium system test points; an X-ray fluorescent spectrograph is used for collecting the signal intensity of uranium and zirconium elements; a multiple regression model of the signal intensity and the quality concentration of the uranium and zirconium elements is built; an SPSS technology is used for solving the nonlinear multiple regression equation; the uranium and zirconium system substrate effect correcting method based on the multivariate regression analysis is built. The test points are arranged by using the uniform design theory, so that the arrangement uniformity is realized; the test times can be effectively reduced; the calculation time is saved; the SPSS measure is creatively provided for solving the problem of solving the nonlinear multiple regression model; the multiple regression model is used for building the signal and mass concentration relationship of the uranium and zirconium elements; the complicated substrate effect expression problem is avoided; the difficult problem of uranium and zirconium system substrate effect correction is solved.

Description

technical field [0001] The invention relates to the field of X-ray fluorescence matrix effect correction, in particular to a method for correcting the X-ray fluorescence matrix effect of uranium and zirconium systems. Background technique [0002] The proportional relationship between the X-ray fluorescence (XRF) count rate and the element content in the sample depends on the stability of the proportional coefficient, and the proportional coefficient depends on the type and quantity of the major elements in the component to a certain extent. The influence of this matrix composition leads to the non-linear relationship between the fluorescence count rate of the measured element and the content of the measured element, which is the matrix effect, which is the key to the precision and accuracy of XRF analysis. [0003] There are two main paths for the correction of matrix effects: mathematical calculation and experimental processing. Using a certain experimental method, select...

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Problems solved by technology

In traditional XRF analysis, experimental correction methods such as empirical classification method, dilution method, internal standard method, and incremental method classify samples based on experience or macroscopic physical characteristics, so that the sample to be tested and the standard sample tend to be consistent, avoiding matrix effect correction However, it faces the shortcomings of heavy workload, cumbersome experimental process, and the limitation of the content range of detectable elements; reference calibration methods such as single filter method, compensation method, scattering count rate method, compensation-specific dispersion ratio method Changes in parameters to characterize and correct the influence of the matrix effect, the mathematical model is mature, but the correction of the matrix effect for complex systems cannot meet the analysis requirements

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