Method and apparatus for measuring thermal diffusivity of materials through transient fluorescence

A technology for measuring thermal diffusivity and fluorescence, applied in the direction of material thermal development, etc., can solve the problems of contact resistance, sample damage, sample damage, etc., and achieve the effect of eliminating system errors, low material requirements, and easy acquisition

Active Publication Date: 2017-04-26
WUHAN UNIV
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Problems solved by technology

In the contact measurement method, the sample is generally heated electrically, and the temperature is measured through the temperature dependence of the resistance, such as the hot wire method and the thermal probe method. (2) Th

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  • Method and apparatus for measuring thermal diffusivity of materials through transient fluorescence
  • Method and apparatus for measuring thermal diffusivity of materials through transient fluorescence
  • Method and apparatus for measuring thermal diffusivity of materials through transient fluorescence

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Embodiment Construction

[0030] Below by embodiment, in conjunction with accompanying drawing, the technical scheme of the present invention is described further specifically, as figure 1 As shown, a device for measuring the thermal diffusivity of materials by transient fluorescence includes a semiconductor pulse laser, a vacuum sample chamber, a fluorescence spectrometer 7 and a data collection computer 9, wherein the semiconductor pulse laser is located above the vacuum sample chamber, and between the laser and the vacuum sample chamber A focusing lens 6 and a spectroscope 5 are arranged between the vacuum sample chamber and the fluorescence spectrometer through the spectroscope 5 to transmit the fluorescence signal fed back after the sample is excited, and the fluorescence spectrometer 7 is connected to the data collection computer 9 through the data line 8 .

[0031] The semiconductor pulsed laser includes a semiconductor laser 2 and a pulse signal generator 1, which together form a sample heating...

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Abstract

The invention provides a method and an apparatus for measuring thermal diffusivity of materials through transient fluorescence. The method includes the steps of: (1) irradiating the surface of a sample by means of modulating pulse laser as a heating light source for the sample and an excitation light source for a fluorescence signal; (2) collecting the fed-back fluorescence signal when the sample is excited, and comparing the signal intensity with a fluorescence intensity-temperature curve of the sample, thus obtaining temperature information of the sample; (3) changing the pulse width of the pulse laser for several times to obtain transient temperature increase of the sample in different transient heating periods; and (4) according to an analytic solution expression of temperature field of a heat conduction model of the to-be-tested sample, substituting several groups of test data and performing fitting to obtain the thermal diffusivity of the material. On the basis of the method, a measurement apparatus platform is correspondingly designed. The method is not liable to cause sample damage, has low measurement error and is high in efficiency during the measurement of the thermal diffusivity of materials.

Description

technical field [0001] The invention belongs to the technical field of transient optical measurement of thermal physical properties of materials, and in particular relates to a method and a measurement device for measuring thermal diffusivity of materials by using transient fluorescence. Background technique [0002] The thermal diffusivity of a material is an index to evaluate the internal heat diffusion ability of an object, a very important thermophysical performance parameter of a substance, and an indispensable key parameter for adiabatic design and analysis and calculation. The measurement method of thermal diffusivity is generally an unsteady method, which can also be called a transient method or a dynamic method. The starting point is the unsteady heat conduction differential equation. The measurement principle is to apply thermal disturbance to the sample, measure the response of the sample to the thermal disturbance at the same time, and then determine the thermop...

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Application Information

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IPC IPC(8): G01N25/20
CPCG01N25/20
Inventor 岳亚楠吴昊高建树熊扬恒曾洪涛
Owner WUHAN UNIV
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