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135 results about "Thermal probe" patented technology

Nano thermoelectric seebeck coefficient in-situ quantitative characterization device based on atomic force microscope

ActiveCN102692524AExpand the evaluation function of nanothermoelectric propertiesMaterial analysis by electric/magnetic meansNanotechnologyThermoelectric materialsMagnetic force microscope
The invention discloses a nano thermoelectric seebeck coefficient in-situ quantitative characterization device based on an atomic force microscope, which is used for detecting a microcell seebeck coefficient of a nano thermoelectric material sample to be detected. The nano thermoelectric seebeck coefficient in-situ quantitative characterization device comprises an atomic force microscope in-situ encouraging platform of harmonic signals and a nano thermoelectric seebeck coefficient in-situ detection platform, wherein the atomic force microscope in-situ encouraging platform is used for providing the atomic force microscope platform for developing the nano thermoelectric seebeck coefficient in-situ quantitative characterization device and simultaneously exciting second harmonic generation and third harmonic generation harmonic signals of a microcell of a nano thermoelectric material in situ; and the nano thermoelectric seebeck coefficient in-situ detection platform is used for realizing in-situ real-time detection and processing of a second harmonic generation and a third harmonic generation of the nano thermoelectric material, and displaying an in-situ characterization result of a thermoelectric parameter of the microcell seebeck coefficient. The nano thermoelectric seebeck coefficient in-situ quantitative characterization device combines an atomic force microscope nano detection function, a macroscopic thermal conductance third harmonic generation testing principle, a Joule thermal effect principle and a macroscopic seebeck coefficient testing principle to establish a new method for characterizing the nano thermoelectric seebeck coefficient based on a harmonic effect induced by a thermal probe of a commercial atomic force microscope.
Owner:江苏先进无机材料研究院

Micron-nano thermal detecting and sensing component

The invention discloses a micron-nano thermal detecting and sensing component, comprising a thermal probe for heating and sensing the temperature of a tested sample, a reference probe for detecting an ambient temperature when the thermal probe is used for detecting, a magnetic base used for gripping the baseboard of the thermal probe by a magnetic force and locating the thermal probe, an isolated body arranged below the magnetic base, a locator which is of a pressing board structure and used for pressing the lead of the thermal probe to assist in locating the thermal probe, an output connection body circuit board and a testing support, wherein the output connection body circuit board comprises a printed circuit board and a connector, the printed circuit board is connected with the output end of the reference probe and the output end of the thermal probe, the connector is used for the connection with an external detecting bridge circuit, and the testing support is used for fixing the output connection body circuit board, the magnetic base, the isolated body and the locator. The component provided by the invention has the characteristics of high detecting sensitivity, strong external environment disturbance resistance and the like, and is completely compatible with a commercial atomic force microscope (AFM) to achieve the in-situ acquisition of the topography image and thermal image of the tested sample. The component provided by the invention has the thermal imaging resolution ratio of 60 nanometers which is better than those of the similar imports.
Owner:SHANGHAI INST OF CERAMIC CHEM & TECH CHINESE ACAD OF SCI
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