Method and device for measuring thermal diffusivity of materials by transient fluorescence
A thermal diffusivity and fluorescence measurement technology, applied in the direction of material thermal development, can solve the problems of contact resistance, sample damage, sample damage, etc., to achieve the effect of eliminating system errors, low material requirements, and easy acquisition
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[0030] Below by embodiment, in conjunction with accompanying drawing, the technical scheme of the present invention is described further specifically, as figure 1 As shown, a device for measuring the thermal diffusivity of materials by transient fluorescence includes a semiconductor pulse laser, a vacuum sample chamber, a fluorescence spectrometer 7 and a data collection computer 9, wherein the semiconductor pulse laser is located above the vacuum sample chamber, and between the laser and the vacuum sample chamber A focusing lens 6 and a spectroscope 5 are arranged between the vacuum sample chamber and the fluorescence spectrometer through the spectroscope 5 to transmit the fluorescence signal fed back after the sample is excited, and the fluorescence spectrometer 7 is connected to the data collection computer 9 through the data line 8 .
[0031] The semiconductor pulsed laser includes a semiconductor laser 2 and a pulse signal generator 1, which together form a sample heating...
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