Method for measuring planeness through lattice structure light

A technology of lattice structure and measurement method, applied in measurement devices, optical devices, instruments, etc.

Inactive Publication Date: 2017-05-24
浙江四点灵机器人股份有限公司
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  • Abstract
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Problems solved by technology

[0003] In the prior art, there has not been a method of combining dot matrix structured light with laser triangulation

Method used

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  • Method for measuring planeness through lattice structure light
  • Method for measuring planeness through lattice structure light
  • Method for measuring planeness through lattice structure light

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Embodiment Construction

[0054] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0055] A method for measuring flatness with lattice structured light, comprising: the following steps:

[0056] Step 1: Use the checkerboard calibration board to calibrate the image collector to obtain the internal parameter matrix of the image collector, the distortion coefficient and the external parameters of the image collector relative to the plane to be measured, namely the rotation vector and translation vector. As a preference, the image collector is a monocular camera.

[0057] Step 2: Theoretically deduce the distribution of the lattice structured light on the ideal plane at the position to be measured, and obtain the coordinates of each point in the lattice in the world coordinate system; the lattice structured light is generated by the projection image generated by the projector as the light source , or by the diffraction image g...

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Abstract

The invention discloses a method for measuring planeness through lattice structure light. The method provided by the invention can simply, conveniently and quickly accomplishes medium precision measurement of the planeness through applying principles of the lattice structure light and a laser triangulation method. The method comprises the steps of firstly, through theoretical calculation, obtaining a world coordinate of each light spot of the lattice structure light on an ideal plane; then adopting an image collector calibration method for transforming coordinates to obtain corresponding image coordinates; acquiring images through a camera so as to accomplish transformation from the world coordinates of light spots on each plane to be measured to image coordinates; through operation, obtaining a difference value between the two image coordinates corresponding to each light spot; applying the principle of the laser triangulation method for carrying out coordinate transformation once again, and obtaining physics displacement corresponding to the image coordination difference value; processing the physics displacement of each light spot to obtain the planeness of the plane to be measured.

Description

technical field [0001] It relates to the field of flatness measurement, in particular to a method for measuring flatness with lattice structured light. Background technique [0002] Flatness measurement refers to the variation of the measured actual surface to its ideal plane. The flatness error is to compare the measured actual surface with the ideal plane, and the line value distance between the two is the flatness error value; or by measuring the relative height difference of several points on the actual surface, and then converting it to the line value Flatness error value. The commonly used methods for flatness error measurement are as follows: 1. Flat crystal interferometry: use the working surface of optical flat crystal to reflect the ideal plane, and directly determine the flatness error value of the measured surface by the degree of curvature of the interference fringes. It is mainly used to measure small planes, such as the working surface of the gauge and the f...

Claims

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Application Information

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IPC IPC(8): G01B11/30
CPCG01B11/30
Inventor 林斌曹向群
Owner 浙江四点灵机器人股份有限公司
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