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A method and device for correcting the calibration position of an imaging spectrometer

An imaging spectrometer and calibration technology, which is used in measurement devices, color/spectral characteristic measurement, instruments, etc., can solve the problems of low precision, large gap with the real spectrogram matrix, and difficulty in meeting the requirements, so as to improve the precision and improve the system. Accuracy and the effect of high measurement precision and accuracy

Active Publication Date: 2019-07-09
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0006] Due to the need to take into account 5 wavelengths at the same time, during the calibration process, it is impossible to find parameter data that satisfies the theoretical position of the 5 specified wavelengths and the real position calculated by the image at the same time. There is a large gap in the graph matrix, resulting in a large deviation in the obtained spectrogram matrix, the accuracy is not high, and it is difficult to meet the needs of work and scientific research

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  • A method and device for correcting the calibration position of an imaging spectrometer
  • A method and device for correcting the calibration position of an imaging spectrometer
  • A method and device for correcting the calibration position of an imaging spectrometer

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[0045]In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0046] The terms "first", "second", "third" and "fourth" in the specification and claims of this application and the above drawings are used to distinguish different objects, rather than to describe a specific order . Furthermore, the terms "comprising" and "having", and any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, product, or device comprisi...

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Abstract

The embodiment of the present invention discloses a method for correcting the calibration position of an imaging spectrometer. According to the image processing method and the optical theory design method, multiple calibration wavelengths are respectively calculated corresponding to the actual position and theoretical position of the light spot in the imaging image of the imaging spectrometer. ; Then adjust the position corresponding to the corresponding wavelength in the spectrogram matrix according to the calculated deviation between the actual position of each spot and the corresponding theoretical position of the spot, so as to complete the correction of the calibration position of the imaging spectrometer. The technical solution provided by this application obtains a high-accuracy spectrogram matrix through online detection of the calibration deviation caused by the optical theory design, improves the accuracy of the calibration spectrogram matrix of the imaging spectrometer, outputs high-precision spectra, and improves the accuracy of the imaging spectrometer. System accuracy and measurement accuracy. In addition, the embodiment of the present invention also provides a corresponding implementation device, which further makes the method more practical, and the device has corresponding advantages.

Description

technical field [0001] The invention relates to the technical field of application of imaging spectrometers, in particular to a method and device for correcting calibration positions of imaging spectrometers. Background technique [0002] The traditional imaging system can only obtain the spatial image information of the target scene. The traditional spectrometer determines the material characteristics by obtaining the spectral information of the radiation intensity curve that changes with the wavelength, so as to obtain the target spectral information. Imaging spectroscopy technology combines optical imaging technology with spectral detection technology to form a new remote sensing technology, which solves the problems of traditional optical imagers with images but no spectra and traditional spectrometers with spectra but no images. [0003] The optical system of the imaging spectrometer (remote sensing with high spectral resolution) consists of a pre-telescope system and a...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/27
CPCG01N21/274
Inventor 崔继承王明佳朱继伟姚雪峰潘明忠
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI