Single-particle irradiation experiment testing apparatus, system and method

A single particle irradiation and testing device technology, applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., to achieve the effect of universality, saving time and improving stability

Inactive Publication Date: 2017-06-30
王洋
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The prior art lacks a universal single event irradiation test system that can adapt to different types of test devices

Method used

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  • Single-particle irradiation experiment testing apparatus, system and method
  • Single-particle irradiation experiment testing apparatus, system and method
  • Single-particle irradiation experiment testing apparatus, system and method

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Embodiment Construction

[0040] In order to better clearly express the technical solution of the present invention, the present invention will be further described below in conjunction with the accompanying drawings.

[0041] The technical solution of the present invention firstly provides a single particle irradiation experiment testing device, such as figure 1 As shown, it includes: a test motherboard and a test sub-board connected to the test motherboard, and the test sub-board carries corresponding test devices. That is to say, for different test devices, the single event irradiation test software running on the test motherboard is different, and the software is different due to different test device attributes and different device test procedures.

[0042] The test motherboard is adapted to receive control data sent by an external remote operation computer, control the test sub-board to test the test device based on the control data, and feed back current test data to the external remote operatio...

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Abstract

The invention provides a single-particle irradiation experiment testing apparatus, system and method. The testing apparatus comprises a test motherboard and a test daughter board connected with the test motherboard. The test daughter board and a tested device correspond to each other. The test motherboard is used for receiving control data sent by an external remote operation computer, controlling the test daughter board to test the tested device based on the control data, feeding back the current test data to the external remote operation computer. The apparatus, system and method can be applied to irradiation experiment processes of different types of tested devices.

Description

technical field [0001] The invention relates to the field of space radiation testing, in particular to a single-particle radiation experimental testing device, a single-particle radiation experimental testing system and a single-particle radiation experimental testing method. Background technique [0002] The microelectronic devices of various types of artificial satellites, space probes and other spacecraft operating in space will be affected by the radiation of cosmic rays from space, which will seriously affect the safety of the spacecraft’s in-orbit operation, causing economic and military consequences. An incalculable loss. The radiation damage of spaceborne devices can be divided into single event effect, total dose effect and displacement damage effect. Compared with the total dose effect and displacement damage effect, various types of single event effects such as single event flipping, single event locking, single event function interruption, and single event burni...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 王洋朱明
Owner 王洋
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