An automatic avoidance method for the testing axis of a flying probe testing machine

Abstract

The invention relates to the technical field of circuit board test equipment, and discloses a flying probe tester test shaft automatic avoidance method. The front surface of a flying probe tester is provided with probes Tip 1 and Tip 2 and the reverse surface is provided with probes Tip 3 and Tip 4. According to the automatic avoidance method, firstly points to be tested are allocated to the four probes Tip 1, Tip 2, Tip 3 and Tip 4 and the current mechanical coordinates of each probe are acquired; the mechanical coordinates of each probe are transformed into absolute coordinates, wherein the probes Tip 1 and Tip 2 are based on the probe Tip 1 in the transformation process, and the probes Tip 3 and Tip 4 are based on the probe Tip 3; avoidance is judged through the position relation of the world coordinates of the current measurement points corresponding to the two probes of the same side and the points to be tested, and one of the probes is moved to the avoidance position if avoidance is required; and if avoidance is not required, the world coordinates of the points to be tested are directly transformed into the mechanical coordinates based on themselves and the corresponding probes are moved to the positions of the mechanical coordinates. The method is simple, reliable and easy to implement.

Description

technical field [0001] The invention relates to the technical field of circuit board testing equipment, and more specifically relates to an automatic avoidance method for a testing axis of a flying probe testing machine. Background technique [0002] The flying probe testing machine is an improved instrument for the traditional needle bed online tester. It can replace the needle bed with probes. The X-Y mechanism is equipped with 4 test probes that can move at high speed respectively. During operation, the unit under test is transported into the testing machine through a belt or other conveying system, and then the probes of the fixed testing machine touch the test pad and the via hole, thereby testing a single component of the unit under test. [0003] The flying probe testing machine uses probes to replace the needle bed, and uses multiple motor-driven, fast-moving electrical probes to make contact with the pins of the device and perform electrical measurements. [0004] ...

AI Technical Summary

Problems solved by technology

However, in the existing technology, due to the allocation of test points, the test axis will inevitably collide during high-speed motion, which will inevitably bring losses to customers

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