Two dimensional contour layout method based on variable included angle chain codes

Abstract

The invention relates to a two dimensional contour layout method based on variable included angle chain codes. The two dimensional contour layout method based on variable included angle chain codes includes the steps: extracting a Beamlet curve of the layout boundary and the contour waiting for layout, respectively segmenting according to the segmentation level parameters, connecting each segmenting point to generate a curve, judging the concave characteristic points and the convex characteristic points, and generating concave sections and convex sections; utilizing the section end points to re-extract the Beamlet curve, segmenting the Beamlet curve of the concave section / convex section of the parent material and the matched Beamlet curve, waiting for layout, of the concave section / convex section according to the same segmenting level parameters, and generating the included angle chain codes of the concave and convex sections of the parent material and all the convex sections waiting for layout, and the included angle chain codes of the concave and convex sections of the parent material and all the concave sections waiting for layout; and by means of the obtained included angle, the length of the included angle link, and the area formed through connection of the section end points, utilizing the weighted sum of three different degrees to calculate the difference degree, selecting the section with the minimum difference degree to match, and then completing approach grafting.

Description

technical field [0001] The invention relates to an outline layout method, in particular to a two-dimensional outline layout method based on variable angle chain codes. Background technique [0002] The nesting problem is common in the manufacturing industry. Solving this problem can improve the utilization rate of materials, thereby reducing the production cost of enterprises and improving the competitiveness of enterprises. Therefore, research on layout problems has important application value. [0003] The two-dimensional layout problem is the most widely studied layout problem. The common two-dimensional contour layout methods are mainly divided into three categories: NFP-based layout methods, envelope polygon-based layout methods, and discrete layout methods. Nesting method. Nesting methods based on critical polygons can better solve the layout problem, but this type of method is limited by the calculation of critical polygons. Existing critical polygons have difficulti...

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Problems solved by technology

[0004] In order to solve the deficiencies of the existing nesting methods and further improve the nesting quality

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