Device and method for measuring crack expanding rate of compact tension specimen

A crack growth rate, compact tensile sample technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of measurement stability and accuracy reduction, achieve continuous high-precision measurement, wide application range, and reduce external signals interference effect

Pending Publication Date: 2017-10-10
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Moreover, the contact resistance between the potential measurement lead wire and the sample also changes with th...

Method used

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  • Device and method for measuring crack expanding rate of compact tension specimen
  • Device and method for measuring crack expanding rate of compact tension specimen
  • Device and method for measuring crack expanding rate of compact tension specimen

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Embodiment

[0040] Such as Figure 1-Figure 4 , Figure 7 As shown, the DC potential drop crack growth rate measurement software of the present invention is based on the Labview environment, and the DC potential drop crack growth rate measurement software user interface is provided with: function selection, start measurement, pause measurement, setting, measurement result, measurement speed, initial length, The number of measurements, the storage path, and the crack growth curve, etc., the program flow includes: test parameter input → program start operation → system operation initialization subroutine → when the number of acquisitions is n, the system runs the continuous measurement subroutine → when the result is normal, continue to run ; When the result is abnormal, the system runs the result alarm subroutine, the system suspends the operation, and resumes operation after troubleshooting. The steps for accurate measurement of crack growth rate in compact tensile specimens are as follo...

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Abstract

The invention relates to a device and a method for measuring crack expanding rate of a compact tension specimen, which are applied to continuous high-accuracy measuring of fatigue crack expanding, stress corrosion cracking, corrosion fatigue and other experiments of the compact tension specimen. The device comprises the following hardware of a computer, a GPIB (general purpose interface bus ) card, a multi-channel high-power relay card, a high-accuracy nanovolt micro-ohmmeter, a data switching unit, a high-stability direct current power supply, a shielding conducting wire or a double-strand insulation platinum wire. The device comprises the following software of direct current potential drop crack expanding rate measuring software and a user interface thereof. The device has the advantage that the relay switch is controlled by the direct current potential drop crack expanding rate measuring software to reversely change the direction of the direct current, so as to solve the problem of interference to the measuring accuracy and stability by the contact resistances of lead wire and specimen and electric potential produced by the temperature difference at both ends of the lead wire.

Description

technical field [0001] The invention relates to a device and method for measuring the crack growth rate of a compact tensile sample, which can be applied to continuous high-precision measurement of experiments such as fatigue crack growth, stress corrosion cracking, and corrosion fatigue of the compact tensile sample. Background technique [0002] In the study of crack growth, the compliance method and the potential method are two commonly used methods for measuring the crack growth rate. The flexibility method is not suitable for measurement in high temperature environment, and its resolution is also low. The potential method makes up for the deficiencies of the flexibility method, and can realize automatic measurement controlled by a computer. The potential method can be divided into DC potential method and AC potential method according to the type of power source used. Compared with the AC potential method, the traditional DC potential method has the characteristics of s...

Claims

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Application Information

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IPC IPC(8): G01N3/06
CPCG01N3/066G01N2203/0617G01N2203/0066
Inventor 彭群家董立谨韩恩厚柯伟
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
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