Experiment device for solid refractive index measurement

An experimental device, a technology of refractive index, applied in the measurement of phase influence characteristics, instruments, teaching models, etc., can solve problems such as large errors and inconvenience, and achieve the effect of reducing errors

Active Publication Date: 2017-10-17
HANGZHOU JINGKE INSTR
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The error is large, and it is very inco...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Experiment device for solid refractive index measurement
  • Experiment device for solid refractive index measurement
  • Experiment device for solid refractive index measurement

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] Below in conjunction with accompanying drawing and embodiment the present invention is described in further detail:

[0023] Such as figure 1 and figure 2 As shown, a solid refractive index measurement experimental device includes a base 1, a semiconductor laser 2, a mounting base 3, a rotary encoder 12, a vertical cylinder 13, a cylindrical test chamber 9, a rotating handle 11, a sample iron base 6, Analyzer 16;

[0024] The vertical cylinder 13 is installed on the base 1, the test chamber 9 is installed on the upper end of the vertical cylinder 13, and the inner wall of the test chamber 9 is pasted with flexible solar cells 7. The test chamber 9 is a closed test chamber composed of a chassis, a side wall and a top cover 15, which can be tested in a bright room, wherein the side wall has a laser hole, and the mounting base 3 is installed on the laser hole of the side wall of the test chamber At the position, the semiconductor laser 2 is fixedly connected with the m...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an experiment device for solid refractive measurement. A light beam emitted by a semiconductor laser is radiated to a sheet-shaped solid sample through a polarization sheet; reflection light reflected by the solid sample is radiated to a long-sheet flexible solar battery and is converted to a voltage signal to output; the solid sample is placed on a rotary plate of an experiment chamber which is of a cylinder shape in order to change an incident angle of the light beam; a rotary encoder which is connected to the under of the rotary plate outputs angle information; and the solid refractivity index can be measured and the Fresnel law can be verified by cooperating with an analyzer, and the experiment device for solid refractive index measurement can be conducted in a light lab.

Description

technical field [0001] The invention belongs to a teaching experiment device, more specifically, it belongs to a solid refractive index measurement experiment device used in college physics experiments, and can verify Fresnel's law. Background technique [0002] When light waves pass through the interface of two uniform media, reflection and refraction will occur. At any time, the electric vectors of the incident wave and the reflected wave can be divided into two vectors, one parallel to the incident surface (indicated by P), and one perpendicular to the incident surface. Surface (denoted by S), according to Fresnel's law, in the form of propagation from optically thinner medium to optically denser medium: the reflection intensity of P light decreases gradually with the increase of the incident angle, and when it reaches a certain angle, it will There is a phenomenon that the reflected light intensity tends to zero (the actual experiment shows that the light intensity is th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G09B23/22G01N21/43
CPCG09B23/22G01N21/43
Inventor 乐培界谢文明周锦生斯公寿周小风
Owner HANGZHOU JINGKE INSTR
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap