2 results about "Refractive measurements" patented technology

This application discloses a refractive screening instrument and its evaluation method, relating to the field of optometry technology. It includes a central processing and evaluation module; a pupil positioning and image capture module, which is signal-connected to the central processing and evaluation module. The pupil positioning and image capture module is used to lock onto the subject's eye and capture eye images to determine the pupil center reference point; and a first projection and sensing module. This application, by calibrating all measurement optical paths with the pupil center as a unified reference point, effectively eliminates alignment errors caused by micro-movements of the eyeball, ensures the consistency of multi-source data in spatial coordinates, and improves the repeatability and accuracy of measurements. This application combines basic refractive power measurement with higher-order aberration analysis, enabling not only the acquisition of conventional refractive powers such as spherical and cylindrical lenses, but also the quantitative detection of complex refractive problems such as irregular astigmatism and corneal morphological abnormalities by analyzing the distortion of the grid pattern.

The application provides a method and device for determining the diopter of a tunable optical device and the optical device, comprising: performing interference removal processing on an initial point cloud subset of a polymer layer to obtain a target point cloud subset; determining a center region warping amount of an effective polymer layer region based on the target point cloud subset; and determining the diopter of the tunable optical device according to the center region warping amount. Thus, due to the elastic deformation of the polymer layer caused by the change of the driving voltage, the curvature radius of the polymer layer and the diopter will change. After the elastic deformation of the polymer layer, the three-dimensional point cloud data of the film layer is analyzed to obtain the center region warping amount of the effective polymer layer region, and finally the diopter is calculated according to the center region warping amount and a mapping function. The whole process can be realized by only one three-dimensional topography measuring device, the measurement cost is low, the diopter of all tunable optical devices can be measured, and the overall quality of the tunable optical device is ensured.