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14 results about "Refractive measurements" patented technology

A refractive screener and method of assessment thereof

PendingCN122350608ARefractive measurementsPupil
This application discloses a refractive screening instrument and its evaluation method, relating to the field of optometry technology. It includes a central processing and evaluation module; a pupil positioning and image capture module, which is signal-connected to the central processing and evaluation module. The pupil positioning and image capture module is used to lock onto the subject's eye and capture eye images to determine the pupil center reference point; and a first projection and sensing module. This application, by calibrating all measurement optical paths with the pupil center as a unified reference point, effectively eliminates alignment errors caused by micro-movements of the eyeball, ensures the consistency of multi-source data in spatial coordinates, and improves the repeatability and accuracy of measurements. This application combines basic refractive power measurement with higher-order aberration analysis, enabling not only the acquisition of conventional refractive powers such as spherical and cylindrical lenses, but also the quantitative detection of complex refractive problems such as irregular astigmatism and corneal morphological abnormalities by analyzing the distortion of the grid pattern.
Owner:SHANGHAI SUPORE INSTR

Ophthalmic lens surface microlens array and method for measuring the refractive power thereof

ActiveCN114935447BTesting optical propertiesRefractive measurementsLight beam
This invention discloses a refractive measurement device and method for a microlens array on the surface of a spectacle lens. The refractive measurement device for the microlens array includes: a test module for accommodating a spectacle lens to be tested, the surface of which includes a microlens array; a light source module for providing a variable-aperture and collimated measurement beam; the measurement beam covers and passes through the microlens array; and a receiving module for simultaneously receiving the measurement beam after it has passed through the microlens array and obtaining its intensity distribution, determining the refractive value of each microlens based on the changes in the intensity distribution. This invention not only improves the accuracy of refractive measurement using a microlens array but also improves the measurement efficiency of the microlens array.
Owner:SHENZHEN SHENGDA TONGZE TECH CO LTD

A diopter measurement method, storage medium and electronic device

ActiveCN119837487BRefractometersSkiascopesRefractive measurementsImage pair
The application provides a diopter measurement method, a storage medium and an electronic device, comprising: generating a diopter linear calculation function according to the relationship between diopter and lens position; adjusting the lens position to change the distance between the lens and the eye to be measured; acquiring fundus imaging images of the eye to be measured collected by an image acquisition component under different lens positions respectively; selecting a target fundus imaging image from all fundus imaging images according to a preset rule, and the lens position corresponding to the target fundus imaging image is a target lens position; and inputting the target lens position into the diopter linear calculation function to obtain a diopter measurement result of the eye to be measured. Through the above scheme of the application, the diopter of the eye to be measured can be obtained by linear calculation, greatly simplifying the operation process and improving the diopter measurement efficiency.
Owner:GUANGDONG YUMO MEDICAL TECHNOLOGY CO LTD

A mechanical focusing-free, full-automatic, high-precision and portable lens diopter measuring device

ActiveCN121829994BRefractive measurementsGraphics
The application relates to the technical field of optical measurement, in particular to a mechanical-focusing-free, full-automatic, high-precision and portable lens diopter measuring device, which is characterized in that the application places a to-be-measured lens and a liquid lens coaxially in an imaging system to form an imaging system capable of adjusting total diopter through voltage. Then, the application collects a graphic sequence based on the imaging system, finds the best voltage value corresponding to the image with the largest definition, and finally substitutes the best voltage value into a pre-constructed diopter mapping model to perform relationship mapping of fusion temperature compensation and hysteresis compensation, so that the diopter of the to-be-measured lens is obtained. The liquid lens used by the application has a millisecond-level response, is matched with a high-frame-rate camera, and can complete single measurement within seconds. The lens does not have mechanical moving parts and is free of wear, has a long service life and good stability. The lens is based on an embedded system, has a small size, high integration and low manufacturing cost compared with a traditional automatic focal power meter. The measuring process and result are fully digitalized, and the lens is convenient for storage, tracing, remote transmission and further analysis.
Owner:SIGMA SQUARES (BEIJING) TECH CO LTD

Ophthalmic examination measurement system and method of controlling the same

ActiveCN119498768BRefractometersSkiascopesRefractive measurementsEyepiece
The application discloses an ophthalmic examination and measurement system and a control method thereof, comprising a biological measurement system, a refractive measurement system and an optical path propagation system; the optical path propagation system comprises an eyepiece with a ring-shaped light plate and a transmission mirror capable of transmitting and reflecting light. The biological transverse parameter, the biological longitudinal parameter and the refractive power of the eye can be measured by using a set of systems; the emission system of the refractive measurement system is configured with a checkered light spot generation module for generating a checkered light spot for irradiating the eye, so that the problem of poor resolution of the ring-shaped light spot in the prior art can be avoided, and the speed of judging the refractive state can be improved by comparing the checkered light spots formed in front and back, and the accuracy of the examination result is also improved.
Owner:GUANGDONG YUMO MEDICAL TECHNOLOGY CO LTD

A double optical path refractive measurement type precision leveling machining platform and a working method thereof

ActiveCN120715738BGrinding feed controlGrinding work supportsLaser transmitterRefractive measurements
The application provides a double-optical-path refractive measurement type precision leveling machining platform and a working method thereof, and belongs to the technical field of ultra-precision plane machining equipment. In order to solve the problems of low machining precision and low efficiency of the existing plane machining, the machining platform comprises a supporting table, a machining device, a limiting component, a positioning component and a leveling component. The workpiece to be machined is placed on the machining device, and the limiting component can prevent the workpiece to be machined from rotating. The positioning component comprises a first laser emitter, a first photosensitive position sensor, a second laser emitter, a second photosensitive position sensor and a double-face transmission mirror. The positioning component can detect whether the workpiece to be machined is horizontal. The leveling component can adjust the inclination angle between the workpiece to be machined and the horizontal plane. The machining platform can realize plane machining of the workpiece to be machined, detect whether the workpiece to be machined is horizontal and level the workpiece to be machined, realize real-time monitoring and correction, and improve machining precision and machining efficiency.
Owner:CHANGCHUN TONGSHI PHOTOELECTRIC TECH CO LTD

Automatic skiascopy optometry system and method based on reflected light velocity analysis

PendingCN121176844ARefractometersSkiascopesRefractive measurementsClosed loop feedback
The invention discloses an automatic skiascopy optometry system and method based on reflected light velocity analysis, and the system comprises an incident light plate, an automatic lens assembly, a photoelectric detection mechanism and a calculation processor, the incident light plate is used for projecting a beam of incident light band with a fixed swing speed and a fixed width to human eyes, the photoelectric detection mechanism is used for receiving a reflection light band reflected by the human eye retina and generating an electric signal. The calculation processor is configured to continuously analyze the electric signals to calculate the moving speed and direction of the reflection light band; a closed-loop feedback is executed, and as long as the moving speed is not zero, the turntable is commanded to rotate so as to change the degree of the lens; and when the moving speed is zero, rotation is stopped, and the current lens degree is output as a refraction measurement result. Unification of measurement references is guaranteed through fixed incident light band projection, and objective and accurate refraction measurement is realized through signal analysis and closed-loop feedback automatic adjustment of the lens degree by the calculation processor.
Owner:PEKING UNIVERSITY THIRD HOSPITAL (THE THIRD CLINICAL MEDICAL SCHOOL OF PEKING UNIVERSITY)

Improved lens diopter and microstructure detection device and method based on diaphragm structure

PendingCN121898750AGeometric properties/aberration measurementRefractive measurementsDiaphragm structure
The invention discloses a lens diopter and microstructure detection device and method based on diaphragm structure improvement, the lens diopter and microstructure detection device comprises a support table, a focusing assembly and an imaging assembly, the focusing assembly and the imaging assembly are both installed on the support table, a nested Hartmann diaphragm is installed on the imaging assembly, and the Hartmann diaphragm is installed on the support table. The lens to be measured is arranged between the nested Hartmann diaphragm and the focusing assembly, the optical axes of the nested Hartmann diaphragm, the lens to be measured, the focusing assembly and the imaging assembly are located in the same plane, and the nested Hartmann diaphragm comprises a microstructure observation area and a diopter measurement area nested in the middle of the microstructure observation area. A micropore array is arranged on the diopter measuring area, and a green light blocking film is arranged on the surface of the diopter measuring area. According to the invention, the problems of low detection efficiency and large manual error due to the adoption of multi-device operation in existing focal power detection and microstructure analysis can be solved.
Owner:DONGHUA UNIV

Optical system for diopter measurement and diopter measurement instrument

PendingCN121694674ARefractometersSkiascopesRefractive measurementsLight beam
The invention discloses an optical system for diopter measurement and a diopter measurement instrument, and relates to the technical field of diopter measurement. The optical system for diopter measurement comprises a projection light path and a measurement light path, the projection light path further comprises a projection light source, a diaphragm and a digital micro-mirror array shared by the measurement light path, the projection light source, the diaphragm and the measurement light path are sequentially arranged, the digital micro-mirror array comprises a plurality of micro-mirrors, each micro-mirror can independently deflect and has a first deflection state and a second deflection state, and the first deflection state and the second deflection state are different. The micro-reflector in the first deflection state can reflect a projection light beam projected by the diaphragm to the steering beam combiner, and the micro-reflector in the second deflection state is located on the path of the measurement light path; wherein the plurality of micro-reflectors in the first deflection state are matched to form a pixel pattern, and the plurality of micro-reflectors can be switched between the first deflection state and the second deflection state, so that the pixel pattern is changed to zoom a projection light path. According to the technical scheme provided by the invention, the measurement precision of the diopter is improved.
Owner:北京九辰智能医疗设备有限公司

Full-automatic, high-precision and portable lens diopter measuring device without mechanical focusing

The invention relates to the technical field of optical measurement, in particular to a full-automatic, high-precision and portable lens diopter measuring device without mechanical focusing, and aims to coaxially place a to-be-measured lens and a liquid lens in an imaging system to form the imaging system capable of performing voltage regulation on total diopter. And then acquiring a graph sequence based on an imaging system, and finding an optimal voltage value corresponding to the image with the maximum definition. And finally, substituting the optimal voltage value into a pre-constructed diopter mapping model to execute relational mapping fusing temperature compensation and hysteresis compensation to obtain the diopter of the to-be-measured lens. The liquid lens used in the invention has millisecond-level response and cooperates with the high-frame-rate camera, so that single measurement can be completed within a second level. No mechanical moving part exists, abrasion is avoided, the service life is long, and stability is good. Based on an embedded system, the size is small, the integration level is high, and the manufacturing cost is lower than that of a traditional automatic lensometer. The measurement process and result are fully digitalized, and storage, tracing, remote transmission and further analysis are facilitated.
Owner:SIGMA SQUARES (BEIJING) TECH CO LTD

Diopter measurement system, method and related device

PendingCN121714208ARefractometersSkiascopesIr reflectionRefractive measurements
The embodiment of the invention discloses a diopter measurement system and method and a related device. The diopter measurement system comprises a watching assembly, an illumination assembly, a scanning assembly, an imaging assembly and a measurement assembly, wherein the scanning assembly is used for adjusting the angles of telecentric light and scattered light entering the eyes of a user, receiving fundus reflected light of the eyes of the user, adjusting the emergent angle of the fundus reflected light and guiding the fundus reflected light to the measuring assembly; the imaging assembly is used for carrying out iris imaging on the human eyes of the user, determining the central position of the human eyes of the user and determining cornea curvature related parameters of the human eyes of the user through cornea reflected light; and the measuring assembly is used for generating infrared light, guiding the infrared light to the scanning assembly, emitting the infrared light to the human eyes of the user through the scanning assembly, receiving infrared reflected light of the human eyes of the user to the infrared light, and determining related parameters of the diopter of the human eyes of the user according to the infrared reflected light. In this way, refraction measurement at different angles is achieved, and meanwhile the function of measuring relevant parameters of the human cornea curvature is integrated.
Owner:SHENZHEN CERTAINN TECH CO LTD +1

Optical thin film parameter nondestructive measurement equipment and method

The invention discloses optical thin film parameter nondestructive measurement equipment and method, and the equipment comprises a sample stage, the sample stage is provided with a light through hole, the sample stage is used for placing a thin film sample, the interior of the sample stage is a hollow light trap, and the light trap is used for absorbing transmission light passing through the thin film sample; the measuring equipment is further provided with an optical measuring system, and an intelligent program is arranged in the optical measuring system. The optical thin film parameter nondestructive measurement device and method have the advantages of being rapid, convenient, low in cost, optical, non-contact and nondestructive in measurement, a measured sample does not need to be pretreated when optical thin film thickness and refraction measurement is carried out, the measurement process is greatly simplified, and the sample is still intact after measurement is completed.
Owner:CHENGUANG (CHANGZHOU) NEW MATERIAL TECH CO LTD

A method, apparatus and optical device for determining the diopter of a tunable optical device

PendingCN122171171AUsing optical meansTesting optical propertiesRefractive measurementsPoint cloud
The application provides a method and device for determining the diopter of a tunable optical device and the optical device, comprising: performing interference removal processing on an initial point cloud subset of a polymer layer to obtain a target point cloud subset; determining a center region warping amount of an effective polymer layer region based on the target point cloud subset; and determining the diopter of the tunable optical device according to the center region warping amount. Thus, due to the elastic deformation of the polymer layer caused by the change of the driving voltage, the curvature radius of the polymer layer and the diopter will change. After the elastic deformation of the polymer layer, the three-dimensional point cloud data of the film layer is analyzed to obtain the center region warping amount of the effective polymer layer region, and finally the diopter is calculated according to the center region warping amount and a mapping function. The whole process can be realized by only one three-dimensional topography measuring device, the measurement cost is low, the diopter of all tunable optical devices can be measured, and the overall quality of the tunable optical device is ensured.
Owner:KUNSHANSHAN TITANIUM ZHIXING ZHIYUAN TECHNOLOGY CO LTD

Retina peripheral defocus detection method and system

PendingCN122030871AImage analysisRefractometersSpherical powerRefractive measurements
The invention relates to a retina peripheral defocus detection method and system in the technical field of optical detection, and the method comprises the following steps: driving a moving lens to a preset fogging position, and guiding a user to perform fogging relaxation; keeping a fogging relaxed state, and controlling the mobile lens to execute diopter scanning from a preset fogging position according to a preset step length; controlling the movable lens to axially move within the diopter measurement range at a preset step length, acquiring an image stack after each axial movement to obtain a second image sequence, performing registration processing, identifying center coordinates of all projection light spots, and delimiting a region of interest; calculating a definition evaluation value in each region of interest, and calculating a spherical power; according to the method, astigmatism degree calculation and astigmatism angle calculation are carried out to obtain astigmatism degrees and astigmatism axial positions, the astigmatism degrees and the astigmatism axial positions are mapped to a retina coordinate system, a continuous retina peripheral defocus topographic map is output, and the problem that an existing peripheral defocus detection method excessively depends on fundus natural textures, so that peripheral measurement precision is poor is solved.
Owner:杭州瞳创医疗科技有限公司 +1