Dual-energy analysis grating

A technology for analyzing gratings and gratings, applied in the field of X-ray imaging, can solve the problems of increasing the amount of radiation received by the measured object, requiring very high stepping accuracy, and increasing the complexity of the system, achieving short imaging time and reducing mechanical accuracy. requirements, the effect of reducing radiation

Pending Publication Date: 2017-10-24
TIANJIN POLYTECHNIC UNIV
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Problems solved by technology

The phase extraction algorithm of grating phase contrast imaging used the multi-step shift method in the early stage, and Chen Bo proposed the two-step phase shift method in 2008 [11] , in 2010 Liu Xin proposed a two-step arbitrary displacement method [12] , although the number of grating displacement steps is getting smaller and smaller, the imaging system still needs a precise stepping platform, which increases the complexity of the system. Multiple steps and exposures make the imaging efficiency low and incr...

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Embodiment Construction

[0060] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific implementation methods and with reference to the accompanying drawings.

[0061]The technical idea of ​​the patent of the present invention is: the dual-energy analysis grating of the present invention is composed of high-energy grid strips and low-energy grid strips. The X-ray energy is 20Kev and 60Kev, and the energy can be adjusted according to needs. When the X-ray energy is 20Kev, the high-energy grid bar metal bismuth has a large thickness, so that the X-ray cannot pass through, and the low-energy grid bar converts the X-ray into visible light. When the X-ray energy is 60Kev, the low-energy grid bar does not have enough thickness for the X-ray conversion, which is equivalent to passing through directly, and the high-energy grid bar converts the X-ray into visible light. The en...

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Abstract

The invention relates to a dual-energy analysis grating. The dual-energy analysis grating mainly comprises high-energy grate bars and low-energy grate bars. The high-energy grate bars can be used for converting high-energy X rays into visible light and screening low-energy X rays, and the low-energy grate bars can be used for converting the low-energy X rays into the visible light and screening the high-energy X rays. The grating is made from caesium iodide (CsI) and bismuth (Bi). According to the dual-energy analysis grating, the defects of the traditional analysis gratings are overcome, and the dual-energy analysis grating is used for converting the X rays of different energies instead of stepping; by applying the dual-energy analysis grating to a dual-energy imaging system, steps of imaging are reduced, the requirements on mechanical accuracy are lowered, and the imaging system is simplified.

Description

technical field [0001] The patent of the present invention relates to the field of X-ray imaging, and is an analysis grating applied to X-ray symmetry imaging systems. Background technique [0002] X-ray imaging technology is widely used in materials science, life science, industrial inspection and other fields, and is an indispensable and important tool for studying the internal structure of substances [1] . The interaction between X-rays and matter can be expressed by the complex refractive index, that is, n=1-α+iβ, where β is the absorption factor and α is the phase factor, which respectively represent the amplitude and phase changes of X-rays after passing through the object [2] . Traditional X-ray detection is based on the difference in the absorption of X-rays by substances, but substances composed of light elements such as C, H, O, and N have weak absorption of X-rays and cannot be effectively imaged. [3] . For matter composed of light elements, the change in X-ra...

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Application Information

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IPC IPC(8): G01N23/04
CPCG01N23/043
Inventor 荣锋梁莹
Owner TIANJIN POLYTECHNIC UNIV
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