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Reading circuit for stored data of electrically programmable fuse wire, and electronic apparatus

A technology for storing data and reading circuits, applied in static memory, instruments, etc., can solve problems such as easy errors in reading stored data, achieve simple and reliable circuits, and reduce the probability of misreading

Inactive Publication Date: 2017-10-24
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional eFuse is also prone to errors in reading stored data during HTOL testing

Method used

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  • Reading circuit for stored data of electrically programmable fuse wire, and electronic apparatus
  • Reading circuit for stored data of electrically programmable fuse wire, and electronic apparatus
  • Reading circuit for stored data of electrically programmable fuse wire, and electronic apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0040] Refer below figure 2 A circuit for reading data stored in an electric programmable fuse according to an embodiment of the present invention will be described. figure 2A schematic diagram of a circuit 200 for reading data stored in an electrical programmable fuse according to an embodiment of the present invention is shown.

[0041] Such as figure 2 As shown, the reading circuit 200 for data stored in the electric programmable fuse includes a pulse signal module 201 , an amplifier module 202 and a trigger module 203 .

[0042] Wherein, the pulse signal module 201 is connected to the electric programmable fuse eFuse, and uses the pulse signal to control the switching on of the electric programmable fuse eFuse during the period of reading data stored in the electric programmable fuse.

[0043] The amplifier module 202 is connected to the pulse signal module 201 and amplifies the output signal of the pulse signal module 201 .

[0044] The flip-flop module 203 is conne...

Embodiment 2

[0067] Another embodiment of the present invention provides an electronic device, which includes a reading circuit for storing data in an electric programmable fuse, and the reading circuit for reading data stored in an electric programmable fuse is the reading circuit described in the first embodiment above. circuit.

[0068] The electronic device can be any electronic product or equipment such as mobile phone, tablet computer, notebook computer, netbook, game console, TV, VCD, DVD, navigator, camera, video camera, recording pen, MP3, MP4, PSP, etc. It is an intermediate product with the above-mentioned semiconductor device, for example: a mobile phone motherboard with the integrated circuit, etc.

[0069] The electronic device also has the above-mentioned advantages due to the higher performance of the included circuit for reading data stored in the electric programmable fuse.

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Abstract

The invention provides a reading circuit for stored data of an electrically programmable fuse wire, and an electronic apparatus. The reading circuit for the stored data of the electrically programmable fuse wire comprises a pulse signal module, an amplifier module and a trigger module, wherein the pulse signal module is connected to the electrically programmable fuse wire and controls switch-on of the electrically programmable fuse wire by utilizing a pulse signal during a reading cycle of the stored data of the electrically programmable fuse wire; the amplifier module is connected to the pulse signal module and amplifies an output signal of the pulse signal module; and the trigger module is connected to the amplifier module to sample an output signal of the amplifier module, and outputs the sampled signal under the control of a clock signal. According to the reading circuit, the time for enabling a current to flow through the electrically programmable fuse wire can be greatly shortened, and the misreading probability caused by soft electro migration is reduced, so that the performance of the electrically programmable fuse wire in HTOL testing is improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a reading circuit and an electronic device for storing data in an electric programmable fuse. Background technique [0002] Integrated circuit semiconductor devices may include a large number of electrically programmable fuses (eFuses), which can be used for non-volatile memory. The eFuses can be electrically programmed (ie, fused) individually within the integrated circuit. The eFuse technology emerged on the basis of the original integrated circuit technology. It has many advantages. It can not only implement redundancy, thereby achieving a high yield of the chip, but also enable the chip to be automatically programmed to be more automated and intelligent. [0003] Nowadays, the theory and technology of electric programmable fuses are gradually mature, and the scope of application continues to expand, so higher requirements are put forward for its stability and rea...

Claims

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Application Information

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IPC IPC(8): G11C29/44G11C29/50
CPCG11C29/44G11C29/50004
Inventor 邱星福陈先敏罗睿明吴蕾杨家奇
Owner SEMICON MFG INT (SHANGHAI) CORP
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