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Microwave electric field intensity measurement method and measurement device

A technology of electric field strength and measuring device, applied in electrostatic field measurement and other directions, can solve the problem of limited detection accuracy of microwave electric field measurement, such as transparent window for detection light, etc.

Inactive Publication Date: 2017-11-07
SOUTH CHINA NORMAL UNIVERSITY
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Problems solved by technology

[0003] However, according to the current experimental measurement and theoretical analysis, the measurement accuracy of the microwave electric field based on the EIT slow light effect of Rydberg atoms is limited by the width of the probe light transparent window, which is limited by the laser line width, transition Effects of Broadening, Shot Noise, and Rydberg Atom Decoherence

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  • Microwave electric field intensity measurement method and measurement device
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  • Microwave electric field intensity measurement method and measurement device

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[0026] The following describes the implementation of the present invention through specific specific examples in conjunction with the accompanying drawings. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various details in this specification can also be based on different viewpoints and applications, and various modifications and changes can be made without departing from the spirit of the present invention.

[0027] figure 1 It is a system architecture diagram of a microwave electric field intensity measurement device of the present invention. Such as figure 1 As shown, a microwave electric field intensity measuring device of the present invention includes a photodetector 1, a vacuum device 2, a first laser 4, a second laser 6, a first acousto-optic modulator 7, a second acou...

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Abstract

The invention discloses a microwave electric field intensity measurement method and a measurement device. The measurement method comprises the steps that coupling light and probing light generated by a laser excite clod atoms in vacuum equipment from a ground state to the Rydberg state coherently; the ground state and the Rydberg state are taken as two internal states of the Raman effect, the appropriate detuning is selected, microwaves generated by a microwave source are applied to the clod atoms, and a Raman absorption peak of the clod atoms is enabled to split; the splitting width of the Raman absorption peak is measured, and the electric field intensity of the microwave source is calculated according to the splitting width. The measurement method disclosed by the invention is based on a technology of cold Rydberg atom manipulation, utilizes the Raman effect to suppress spontaneous radiation to realize narrow-linewidth absorption peak splitting, realizes the purpose of improving the microwave electric field measurement accuracy by an order of magnitude through measuring the splitting width of the Raman absorption peak, and thus provides a new technology foundation for studying precision measurement for the microwave electric field.

Description

Technical field [0001] The invention relates to a microwave electric field intensity measuring method and measuring device. Background technique [0002] In 2012, the Shaffer research group of Oklahoma University in the United States and the Pfau research group of Stuttgart University in Germany used the Rydberg atom EIT and AT (Autler-Townes) split for the first time to convert the measurement of microwave electric field strength into optical frequency measurement, which was realized experimentally Microwave electric field measurement, the minimum electric field intensity measured is 8μVcm 1 , The sensitivity is 30μVcm -1 Hz -1 / 2 , Far better than the traditional dipole antenna microwave electric field meter. Then in 2013, they realized the measurement of the microwave polarization direction based on the original experiment, and the polarization measurement accuracy was 0.5°. In 2014, the National Institute of Standards and Technology (NIST) experimentally realized high-precisi...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/12
CPCG01R29/12
Inventor 程爱琴廖开宇张新定黄巍杜炎雄颜辉
Owner SOUTH CHINA NORMAL UNIVERSITY
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