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Method for detecting dark strip defects of surface of CTP plate base

A detection method and underworld technology, which is applied in the direction of optical testing of flaws/defects, measuring devices, and material analysis through optical means, can solve problems such as inability to detect deeper defects, and achieve quality improvement, loss reduction, and early detection. found effect

Inactive Publication Date: 2017-12-19
CHINALCO RUIMIN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The method is to place the sample in the electrolyte (mixing an appropriate amount of sulfuric acid and tap water to prepare the electrolyte in a volume of (2+23)) as the anode, and the lead plate as the cathode. 0~430V, output current 0~500A), anodic oxidation occurs on the surface of the sample. This method can only detect shallow defects of 1~2μm on the surface of the strip, and cannot detect deeper defects.

Method used

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  • Method for detecting dark strip defects of surface of CTP plate base
  • Method for detecting dark strip defects of surface of CTP plate base
  • Method for detecting dark strip defects of surface of CTP plate base

Examples

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Embodiment 1

[0020] A method for detecting black channel defects on the surface of a CTP plate base, the specific steps are:

[0021] 1) Wash the CTP plate base cold-rolled to the thickness of the finished product with alkali in 5.0wt% NaOH solution for 30s, remove the aluminum powder and oil on the surface, and then wash with water;

[0022] 2) Then use sulfur-phosphorus mixed acid to polish, the temperature is 85°C, the time is 50s, after polishing, neutralize with 5.0wt% NaOH solution for 3s, and then rinse with water; then under ordinary light or sunlight, directly Observe underworld flaws.

Embodiment 2

[0024] A method for detecting black channel defects on the surface of a CTP plate base, the specific steps are:

[0025] 1) Wash the CTP plate base cold-rolled to the thickness of the finished product with alkali in 5.5wt% NaOH solution for 25s, remove the aluminum powder and oil on the surface, and then wash with water;

[0026] 2) Then use sulfur-phosphorus mixed acid to polish, the temperature is 90°C, the time is 40s, after polishing, neutralize with 5.0wt% NaOH solution for 3s, and then rinse with water; then under ordinary light or sunlight, directly Observe underworld flaws.

Embodiment 3

[0028] A method for detecting black channel defects on the surface of a CTP plate base, the specific steps are:

[0029] 1) Alkaline wash the CTP plate base cold-rolled to the finished product thickness in 6.0wt% NaOH solution for 20s, remove the surface aluminum powder oil, and then wash with water;

[0030] 2) Then use sulfur-phosphorus mixed acid to polish, the temperature is 95°C, the time is 30s, after polishing, neutralize 3S with 5.0wt% NaOH solution, and then rinse with water; then under ordinary light or sunlight, directly Observe underworld flaws.

[0031] From the comparison of Examples 1-3, it can be seen that after the treatment of step 1) and step 2) in Example 2, the surface gloss of the product on the surface of the aluminum material is the best. The "dark stripes" formed by aluminum and pits are revealed, and are easier to observe with the naked eye; while the effects of Example 1 and Example 3 are a little worse than those of Example 2.

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Abstract

The invention belongs to the field of detection of aluminum materials, and concretely relates to a method for detecting the dark strip defects of the surface of a CTP plate base. The method comprises the following steps: carrying out alkali washing on the cold-rolled CTP plate base having an exit thickness, polishing the washed CTP plate base with a sulfuric acid and phosphoric acid mixed acid, leveling and polishing the treated CTP plate base by using the difference of the dissolving speeds of the concave position and the convex position of the surface of an aluminum material in a solution to expose dark strips formed by sticky aluminum and pits in the original continuous casting and continuous rolling process, and directly observing the dark strips in common lamp lights or sunshine. The method can rapidly and accurately detect the dark strip defects having a thickness of 3-6 [mu]m below the surface layer of the plate base, avoids quality complaint caused by defective products going to downstream clients, and can realize the earlier finding of the quality defects in order to improve the quality and reduce the loss.

Description

technical field [0001] The invention belongs to the detection field of aluminum materials, and in particular relates to a detection method for black track defects on the surface of a CTP plate base. Background technique [0002] Precoated photosensitive plate (referred to as PS plate) is a high-quality printing plate in lithographic printing. It has many advantages such as easy plate making and excellent printing performance. With the development of economy and the application of laser phototypesetting system, it has replaced typesetting printing. The CTP version (Computer-to-plate-making in Chinese) is an upgraded high-end product of the PS version, which saves materials such as film and manual imposition, reduces labor costs, shortens plate-making time, and is more energy-saving and environmentally friendly. As the base material of PS plate or CTP plate, aluminum substrate has become the mainstream PS / CTP plate base material due to its advantages of low density, good stabi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/8803
Inventor 魏祥昭陈国生郑超蜜林盛谢其成潘飚
Owner CHINALCO RUIMIN
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