Semiconductor device with stacked layout

A technology for semiconductors and devices, applied in the field of semiconductor devices, can solve problems such as increasing difficulty, and achieve the effects of simplifying electrical connections and simplifying channel doping

Pending Publication Date: 2017-12-19
INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW) +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, continued scaling increases the difficulty of manufacturing

Method used

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  • Semiconductor device with stacked layout
  • Semiconductor device with stacked layout
  • Semiconductor device with stacked layout

Examples

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Example Embodiment

[0059] Detailed embodiments of the inventive concept will now be described with reference to the drawings. However, the inventive concept can be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein; on the contrary, these embodiments are provided as examples, so that the present disclosure will be Those skilled in the art convey the scope of the inventive concept.

[0060] The scalability of thin-body devices (eg, fin transistors at the 5nm node and beyond) continues to challenge maintaining acceptable performance parameters such as sub-threshold slope (SS) and short channel effect (SCE). The gate fully enclosed (GAA) nanowire transistor (LFET) can provide superior control of the gate on a fully depleted channel, and allows the gate length to be further adjusted by the nanowire (NW) with a diameter of 4-7nm Scaled to 15nm. However, in conventional 2D layouts, gate length, sidewall spacers, and source / drain contacts co...

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Abstract

The disclosed technology generally relates to semiconductor devices, and more particularly to semiconductor devices having a stacked arrangement, and further relates to methods of fabricating such devices. In one aspect, a semiconductor device comprises a first memory device and a second memory device formed over a substrate and at least partly stacked in a vertical direction. Each of the first and second memory devices has a plurality of vertical transistors, wherein each vertical transistor has a vertical channel extending in the vertical direction.

Description

[0001] Cross References to Related Applications [0002] This application claims foreign priority from European Application No. 16174252.3 filed on June 13, 2016, the content of which is hereby incorporated by reference in its entirety. [0003] background technical field [0004] The disclosed technology relates generally to semiconductor devices, and more particularly to semiconductor devices having stacked arrangements, and also to methods of fabricating such devices. Background technique [0005] The demand for reduced device footprint per memory cell or bit in memory devices and for increased circuit density continues to demand reductions in the gate lengths of transistors of memory devices. Scaling of memory cells also continues to require reduced routing pitch and increased number of lithographic exposures to meet design constraints. However, continued scaling increases the difficulty of manufacturing and / or the difficulty of meeting desired performance and / or energ...

Claims

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Application Information

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IPC IPC(8): H01L27/11H01L21/8244
CPCH10B10/12B82Y10/00H01L29/66439H01L29/66666H01L29/775H01L27/0688H01L29/78642H01L29/0676H01L29/42392H01L29/7869H01L29/41733
Inventor T·胡耶恩 鲍A·维洛索J·雷恰特
Owner INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)
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