Parameter identification based photovoltaic array fault diagnosis method

A photovoltaic array and parameter identification technology, which is applied in photovoltaic power generation, photovoltaic modules, photovoltaic system monitoring, etc., can solve the problems of complex and cumbersome diagnosis process, poor practicability, and low reliability of diagnosis results, so as to reduce the number of sensors and shorten the The effect of cycle time, high confidence and precision
CN107579707AInactive Publication Date: 2018-01-12JIANGSU UNIV

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
JIANGSU UNIV
Publication Date
2018-01-12
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a parameter identification based photovoltaic array fault diagnosis method. The method includes: identifying relevant parameters of a photovoltaic module according to a parameter identification algorithm; acquiring an output characteristic model of the photovoltaic module under different operating conditions; adopting a fault detection algorithm for fault judgment of a photovoltaic group; acquiring an optimal irradiance So and an optimal module temperature To from data acquired by information acquisition equipment, and inputting into the output characteristic model to obtain an optimal output characteristic equation of the current photovoltaic module, inputting branch current acquired by the information acquisition equipment into the optimal output characteristic equation to obtain an optimal output voltage of a current group, comparing with an actual voltage value of the group, and determining that the group has a hard shadow fault if a difference value exceedsa threshold for consecutive F times; judging a fault type according to a fault judging algorithm; displaying three-section positioning data and operating data of the faulted group on a user interfaceof an upper computer to instruct workers to timely check and maintain the photovoltaic module in fault.
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Description

technical field

[0001] The invention relates to the field of photovoltaic array fault diagnosis, in particular to a parameter identification-based photovoltaic array fault diagnosis method. Background technique

[0002] The increasingly prominent energy crisis and environmental pollution have made countries increase the implementation and promotion of renewable energy. Among them, photovoltaic power generation technology has been widely developed and applied due to its unique power generation characteristics. However, due to the large number of photovoltaic array components, the probability of various failures is high. If not handled in time, it may cause serious accidents and hazards, affect the efficiency of the entire power station, and cause huge economic losses. Therefore, effective measures must be taken to detect faults in time to ensure reliable and stable operation of the system.

[0003] The impact of various faults on the output characteristics of photovoltaic mo...

Claims

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