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Electrical data peak processing (EDPP) test method for server graphics processing unit (GPU)

A server, server-side technology, applied in the direction of detecting faulty computer hardware, etc., can solve problems such as low work efficiency, long use time, increase the workload of staff, etc., to achieve the effect of improving work efficiency and reducing test time

Inactive Publication Date: 2018-01-16
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Existing testing methods are manual testing and testing GPUs one by one. It takes a long time to use and manual selection is required, which increases the workload of the staff. The work efficiency is low, and manual selection will inevitably lead to errors and omissions.

Method used

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  • Electrical data peak processing (EDPP) test method for server graphics processing unit (GPU)
  • Electrical data peak processing (EDPP) test method for server graphics processing unit (GPU)

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Embodiment Construction

[0030] In order to clearly illustrate the technical features of this solution, the present invention will be described in detail below through specific implementation modes and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and / or letters in different instances. This repetition is for the purpose of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. It should be noted that components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted herein to avoid unnecessarily limiting the...

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Abstract

The invention discloses an electrical data peak processing (EDPP) test method for a server graphics processing unit (GPU). The method comprises the steps of creating a test environment; performing multiple EDPP tests on multiple GPUs simultaneously, wherein a test program is restarted in each test; and recording a test process and a test result. Compared with the prior art, the test process involves no manual labor, thereby making the test result more reliable; and EDPP tests are performed on multiple GPUs simultaneously, so that test time is shortened greatly, and the working efficiency is improved.

Description

Technical field [0001] The invention relates to the technical field of server GPU testing, specifically a method for performing EDPP testing on a server GPU. Background technique [0002] Computing server - PCIE-SWITH (PCIE, the full name is peripheral component interconnect express, is a high-speed serial computer expansion bus standard; SWITH, is a server) is a new architecture server, the server in China The cabinet server field can meet customers' needs for high-performance computing servers. [0003] However, in the production and development stage of the server, the testing of its graphics processor (English: Graphics Processing Unit, abbreviation: GPU) is an important link. Due to the large number of test items and the length of each test item during the test, the entire test of a single loop EDPP (EDPP, English full name is electrical date peak processing, power supply data peak processing) takes about 3 hours, and is for multiple nodes. At the same time, the requi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 韩超
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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