Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Embedded substrate

An embedded and substrate technology, which is applied in the direction of electrical components, electric solid devices, circuits, etc., can solve the problems of large chip footprint, limited packaging integration of embedded substrates, and low product reliability, so as to improve packaging integration, The effect of reducing the depth and improving the reliability of the product

Active Publication Date: 2018-01-19
HUAWEI DIGITAL POWER TECH CO LTD
View PDF4 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] This application provides an embedded substrate to solve the problem that the embedded substrate in the prior art has a large area occupied by all chips and low product reliability, which limits the further improvement of the package integration of the embedded substrate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Embedded substrate
  • Embedded substrate
  • Embedded substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] In order to make the purpose, technical solution and advantages of the application clearer, the application will be further described in detail below in conjunction with the accompanying drawings.

[0047] The present application provides an embedded substrate, which is used to solve the problem that the embedded substrate in the prior art has a large area occupied by all chips and low product reliability, which further limits the further improvement of the package integration of the embedded substrate.

[0048] see figure 2 as shown, figure 2 It is a schematic cross-sectional structure diagram of an embedded substrate provided in an embodiment of the present application, and the embedded substrate includes:

[0049] substrate 100, figure 2 The direction indicated by the middle arrow A is the thickness direction of the substrate 100, and a first chamber 110 is respectively provided on both sides of the substrate 100 in the thickness direction, and the depth of each...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of integrated circuits, and discloses an embedded substrate. The embedded substrate is used for solving a problem that an embedded substrate limits the further improvement of the packaging integration degree in the prior art because all chips of the embedded substrate occupies a bigger space and the reliability of products is lower. The embedded substrate comprises a substrate, wherein two sides of the substrate in the thickness direction are respectively provided with at least one first cavity and at least two first electronic devices, and each first electronic device is corresponding to one first cavity; packaging layers which are respectively disposed in each first cavity and respectively wrap the first electronic devices in the first cavities, and is provided with a plurality of first connection holes, wherein each first connection hole is corresponding to one pin of one first electronic device, and is connected with a corresponding pin;and a conductive circuit layer, wherein a part of the conductive circuit layer is disposed in the first connection holes to be connected with the pins corresponding to the first connection holes.

Description

technical field [0001] The present application relates to the technical field of integrated circuits, in particular to an embedded substrate. Background technique [0002] As the design trend of electronic products is moving toward miniaturization and thinning, the packaging integration of product modules is also increasing. At present, high-density interconnection integration technology that embeds chips in substrates has emerged in the industry. The structure of the embedded substrate made by this technology is as follows figure 1 as shown, figure 1 It is a schematic cross-sectional structure diagram of a common embedded substrate at present, which includes a substrate 10 and a first chip 20 and a second chip 30 packaged in the substrate 10, wherein a plurality of cavities 11 are formed on the substrate 10 , each cavity 11 is packaged with a first chip 20 or a second chip 30 by resin 40, the pads 21 of the first chip 20, the front pads 31 and the back pads 32 of the seco...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L23/498H01L23/31
CPCH01L2224/73267H01L2224/8384H01L2224/92244H01L2224/96H01L2924/15153H01L2924/19105H01L23/31H01L23/498H01L2224/04105H01L2224/18H01L2224/2518H01L2224/32245
Inventor 彭浩廖小景王军鹤
Owner HUAWEI DIGITAL POWER TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products